http://www.cnr.it/ontology/cnr/individuo/prodotto/ID32669
Critical strain region evaluation of self-assembled semiconductor quantum dots (Articolo in rivista)
- Type
- Label
- Critical strain region evaluation of self-assembled semiconductor quantum dots (Articolo in rivista) (literal)
- Anno
- 2007-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1088/0957-4484/18/47/475503 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Sales D.L. a; Pizarro J. b; Galindo P.L. b; Garcia R. a; Trevisi G. c; Frigeri P. c; Nasi L. c; Franchi S. c; Molina S.I. a (literal)
- Pagina inizio
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- http://iopscience.iop.org/0957-4484/18/47/475503 (literal)
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- Rivista
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
- Note
- Scopu (literal)
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- a Departamento de Ciencia de Los Materiales e I. M. Y Q. I., Universidad de Cádiz, Puerto Real, Cádiz, Spain;
b Departamento de Lenguajes Y Sistemas Informáticos, Universidad de Cádiz, Puerto Real, Cádiz, Spain;
c CNR-IMEM Institute, Parco Delle Scienze 37a, 43100, Parma, Italy (literal)
- Titolo
- Critical strain region evaluation of self-assembled semiconductor quantum dots (literal)
- Abstract
- A novel peak finding method to map the strain from high resolution transmission electron micrographs, known as the Peak Pairs method, has been applied to In(Ga)As/AlGaAs quantum dot (QD) samples, which present stacking faults emerging from the QD edges. Moreover, strain distribution has been simulated by the finite element method applying the elastic theory on a 3D QD model. The agreement existing between determined and simulated strain values reveals that these techniques are consistent enough to qualitatively characterize the strain distribution of nanostructured materials.
The correct application of both methods allows the localization of critical strain zones in semiconductor QDs, predicting the nucleation of defects, and being a very useful tool for the design of semiconductor devices. (literal)
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