Temperature dependence of the electrical activity of localized defects in InGaN-based light emitting diodes (Articolo in rivista)

Type
Label
  • Temperature dependence of the electrical activity of localized defects in InGaN-based light emitting diodes (Articolo in rivista) (literal)
Anno
  • 2006-01-01T00:00:00+01:00 (literal)
Alternative label
  • Pavesi M., Manfredi M., Rossi F., Meneghini M., Zanoni E., Zehnder U. and Strauss U. (2006)
    Temperature dependence of the electrical activity of localized defects in InGaN-based light emitting diodes
    in Applied physics letters
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Pavesi M., Manfredi M., Rossi F., Meneghini M., Zanoni E., Zehnder U. and Strauss U. (literal)
Pagina inizio
  • 041917 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 89 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Titolo
  • Temperature dependence of the electrical activity of localized defects in InGaN-based light emitting diodes (literal)
Prodotto di
Autore CNR

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