New approach for high resistivity CdTe preparation (Articolo in rivista)

Type
Label
  • New approach for high resistivity CdTe preparation (Articolo in rivista) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Alternative label
  • Zha M., Bissoli F., Zanotti L., Paorici C. (2003)
    New approach for high resistivity CdTe preparation
    in Journal of materials processing technology
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Zha M., Bissoli F., Zanotti L., Paorici C. (literal)
Pagina inizio
  • 425 (literal)
Pagina fine
  • 429 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 143-4 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Titolo
  • New approach for high resistivity CdTe preparation (literal)
Abstract
  • Cadmium telluride (CdTe) is one of the important members of II–VI semiconductor compounds. In various applications, for example, X-ray detectors, photo-refractive and electro-optical devices, semi-insulating (SI) materials are necessary. Though extensive studies have been devoted to the selection of a suitable doping element for obtaining SI crystals, only a few have dealt with intrinsic electronic properties. For this reason, a systematic exploration of the intrinsic properties of undoped CdTe with the aim of growing nominally pure CdTe crystals has been carried out. Results are reported on: (i) direct synthesis of 7N pure elements; (ii) stoichiometry correction procedure based on a specially devised post-synthesis heat treatment; (iii) evaluation of the stoichiometry deviation of CdTe by means of partial vapour pressure measurements; (iv) crystal growth carried out from vapour phase (sublimation) and from the melt (normal freezing); (v) electrical characterization. In particular it is found that in high-purity crystals the electrical resistivity critically depends on the stoichiometry deviation of the material source. (literal)
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