Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique (Articolo in rivista)

Type
Label
  • Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique (Articolo in rivista) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/S0169-4332(02)01400-9 (literal)
Alternative label
  • Boerasu I.; Pereira M.; Vasilevskiy M.; Gomes M.J.M.; Watts B.; Leccabue F.; Vilarinho P.M. (2003)
    Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique
    in Applied surface science
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Boerasu I.; Pereira M.; Vasilevskiy M.; Gomes M.J.M.; Watts B.; Leccabue F.; Vilarinho P.M. (literal)
Pagina inizio
  • 604 (literal)
Pagina fine
  • 610 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 208 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Istituto dei materiali per l'elettronica ed il magnetismo (literal)
Titolo
  • Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique (literal)
Abstract
  • According to the general formula Pb1-X/2 (Zr0.65 Ti0.35)1-X NbX O3+4mol% PbO excess (X=1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(100) substrates using either a Nd:YAG (355nm) or a XeCl (308nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified Sawyer–Tower bridge. (literal)
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