http://www.cnr.it/ontology/cnr/individuo/prodotto/ID32326
Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique (Articolo in rivista)
- Type
- Label
- Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique (Articolo in rivista) (literal)
- Anno
- 2003-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/S0169-4332(02)01400-9 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Boerasu I.; Pereira M.; Vasilevskiy M.; Gomes M.J.M.; Watts B.; Leccabue F.; Vilarinho P.M. (literal)
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Istituto dei materiali per l'elettronica ed il magnetismo (literal)
- Titolo
- Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique (literal)
- Abstract
- According to the general formula Pb1-X/2 (Zr0.65 Ti0.35)1-X NbX O3+4mol% PbO excess (X=1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(100) substrates using either a Nd:YAG (355nm) or a XeCl (308nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified SawyerTower bridge. (literal)
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