Transmission electron microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Transmission electron microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition (Articolo in rivista) (literal)

Anno

• 2006-01-01T00:00:00+01:00 (literal)

Alternative label

• Frabboni, S; Gazzadi, GC; Spessot, A (2006)
  Transmission electron microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition
  in Applied physics letters
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Frabboni, S; Gazzadi, GC; Spessot, A (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 89 (literal)

Rivista

• Applied physics letters (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• INFM, CNR, I-41100 Modena, Italy; Univ Modena, Dipartimento Fis, I-41100 Modena, Italy (literal)

Titolo

• Transmission electron microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition (literal)

Abstract

• The authors present a transmission electron microscopy characterization and sculpting of freestanding Si-O-C nanowires, fabricated by electron beam induced deposition from a tetraethylorthosilicate precursor, in a dual beam system. Electron energy loss spectroscopy and near edge structure analyses performed on as deposited wires show the formation of amorphous silicon dioxide with extra oxygen and carbon content. Subsequent electron beam sculpting by 200 keV transmission electron microscope irradiation decreases carbon and oxygen contents leaving the silicon oxidation state unchanged and narrows Si-O-C wire width to less than 1 nm. (c) 2006 American Institute of Physics. (literal)

Prodotto di

• Nanofabbricazione e fenomeni di superficie interfaccia alla nanoscala (MD.P06.013.001) (Modulo)

Autore CNR

• GIANCARLO GAZZADI (Persona)
• STEFANO FRABBONI (Unità di personale esterno)

Insieme di parole chiave

• Keywords of "Transmission electron microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• GIANCARLO GAZZADI (Persona)
• STEFANO FRABBONI (Unità di personale esterno)

Prodotto

• Nanofabbricazione e fenomeni di superficie interfaccia alla nanoscala (MD.P06.013.001) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Applied physics letters (Rivista)

Insieme di parole chiave di

• Keywords of "Transmission electron microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition" (Insieme di parole chiave)