Depth profiling of ultra-thin alumina layers grown on Co(0001) (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Depth profiling of ultra-thin alumina layers grown on Co(0001) (Articolo in rivista) (literal)

Anno

• 2013-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1088/0953-8984/25/9/095004 (literal)

Alternative label

• Nemsak, S.; Skala, T.; Yoshitake, M.; Prince, K. C.; Matolin, V. (2013)
  Depth profiling of ultra-thin alumina layers grown on Co(0001)
  in Journal of physics. Condensed matter (Print)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Nemsak, S.; Skala, T.; Yoshitake, M.; Prince, K. C.; Matolin, V. (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 25 (literal)

Rivista

• Journal of physics. Condensed matter (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 8 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

• 9 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• National Institute of Materials Science (NIMS) - Japan; Charles University Prague; Elettra Sincrotrone Trieste SCpA; CNR IOM (literal)

Titolo

• Depth profiling of ultra-thin alumina layers grown on Co(0001) (literal)

Abstract

• Epitaxial thin oxide layers were grown by simultaneous aluminum deposition and oxidation on a Co(0001) single crystal, and the metal-oxide interface between the substrate and the grown layer was studied using photoelectron spectroscopy. The oxide layers were composed of two kinds of chemically different layers. Angle-resolved measurements were used to determine the compositions of oxide sub-layers and to reveal their respective thicknesses. The topmost oxide layers were up to 0.23 nm thick, determined by analysis of O 1s and Co 2p(3/2) photoelectron spectra. The results of the analysis show that the interface layer is composed of a mixture of oxygen and cobalt atoms and its thickness is approximately 0.6 nm. The analysis of Co 2p(3/2), Al 2p(3/2) and O 1s core level binding energies confirmed the presence of CoO in the interface layer and Al2O3 in the topmost oxide layer. (literal)

Prodotto di

• MD.P06.016.002 Sistemi a bassa densita' e nanostrutture in fase gassosa (MD.P06.016.004) (Modulo)

Autore CNR

• KEVIN CHARLES PRINCE (Unità di personale esterno)

Incoming links:

Autore CNR di

• KEVIN CHARLES PRINCE (Unità di personale esterno)

Prodotto

• MD.P06.016.002 Sistemi a bassa densita' e nanostrutture in fase gassosa (MD.P06.016.004) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Journal of physics. Condensed matter (Rivista)