http://www.cnr.it/ontology/cnr/individuo/prodotto/ID317281
Copper-ceria interaction: A combined photoemission and DFT study (Articolo in rivista)
- Type
- Label
- Copper-ceria interaction: A combined photoemission and DFT study (Articolo in rivista) (literal)
- Anno
- 2013-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.apsusc.2012.04.098 (literal)
- Alternative label
Szabova, Lucie; Skala, Tomas; Matolinova, Iva; Fabris, Stefano; Camellone, Matteo Farnesi; Matolin, Vladimir (2013)
Copper-ceria interaction: A combined photoemission and DFT study
in Applied surface science
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Szabova, Lucie; Skala, Tomas; Matolinova, Iva; Fabris, Stefano; Camellone, Matteo Farnesi; Matolin, Vladimir (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Charles University Prague; Sincrotrone Trieste; CNR DEMOCRITOS; International School for Advanced Studies (literal)
- Titolo
- Copper-ceria interaction: A combined photoemission and DFT study (literal)
- Abstract
- Stoichiometric and partially reduced ceria films were deposited on preoxidized Ru(0001) crystal by Ce evaporation in oxygen atmosphere of different pressures at 700 K. Copper-ceria interaction was investigated by deposition of metalic copper on both types of substrate. The samples were characterized by low energy electron diffraction (LEED), X-ray photoelectron spectroscopy (XPS) of core states and resonant photoelectron spectroscopy (RPES) of the valence bands. Copper adsorption on stoichiometric ceria caused reduction of CeO2, while on the oxygen-defficient ceria it partially reoxidized the substrate. This is in agreement with DFT+U calculations of copper adsorption on stoichiometric and defective ceria surfaces. (C) 2012 Elsevier B. V. All rights reserved. (literal)
- Prodotto di
- Autore CNR
- Insieme di parole chiave
Incoming links:
- Autore CNR di
- Prodotto
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
- Insieme di parole chiave di