Copper-ceria interaction: A combined photoemission and DFT study (Articolo in rivista)

Type
Label
  • Copper-ceria interaction: A combined photoemission and DFT study (Articolo in rivista) (literal)
Anno
  • 2013-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.apsusc.2012.04.098 (literal)
Alternative label
  • Szabova, Lucie; Skala, Tomas; Matolinova, Iva; Fabris, Stefano; Camellone, Matteo Farnesi; Matolin, Vladimir (2013)
    Copper-ceria interaction: A combined photoemission and DFT study
    in Applied surface science
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Szabova, Lucie; Skala, Tomas; Matolinova, Iva; Fabris, Stefano; Camellone, Matteo Farnesi; Matolin, Vladimir (literal)
Pagina inizio
  • 12 (literal)
Pagina fine
  • 16 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 267 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 5 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Charles University Prague; Sincrotrone Trieste; CNR DEMOCRITOS; International School for Advanced Studies (literal)
Titolo
  • Copper-ceria interaction: A combined photoemission and DFT study (literal)
Abstract
  • Stoichiometric and partially reduced ceria films were deposited on preoxidized Ru(0001) crystal by Ce evaporation in oxygen atmosphere of different pressures at 700 K. Copper-ceria interaction was investigated by deposition of metalic copper on both types of substrate. The samples were characterized by low energy electron diffraction (LEED), X-ray photoelectron spectroscopy (XPS) of core states and resonant photoelectron spectroscopy (RPES) of the valence bands. Copper adsorption on stoichiometric ceria caused reduction of CeO2, while on the oxygen-defficient ceria it partially reoxidized the substrate. This is in agreement with DFT+U calculations of copper adsorption on stoichiometric and defective ceria surfaces. (C) 2012 Elsevier B. V. All rights reserved. (literal)
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