Fabrication and characterization of Er+3 doped SiO2/SnO2 glass-ceramic thin films for planar waveguide applications (Articolo in rivista)

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  • Fabrication and characterization of Er+3 doped SiO2/SnO2 glass-ceramic thin films for planar waveguide applications (Articolo in rivista) (literal)
Anno
  • 2015-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1088/1757-899X/73/1/012102 (literal)
Alternative label
  • S. Guddala, A. Chiappini, C. Armellini, S. Turell, G.C. Righini, M. Ferrari, and D. Narayana Rao (2015)
    Fabrication and characterization of Er+3 doped SiO2/SnO2 glass-ceramic thin films for planar waveguide applications
    in IOP conference series. Materials science and engineering (Online); IOP Publishing Ltd. (Institute of Physics Publishing Ltd), "Bristol ; London" (Regno Unito)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • S. Guddala, A. Chiappini, C. Armellini, S. Turell, G.C. Righini, M. Ferrari, and D. Narayana Rao (literal)
Pagina inizio
  • 012102-1 (literal)
Pagina fine
  • 012102-4 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://iopscience.iop.org/1757-899X/73/1/012102?fromSearchPage=true (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 73 (literal)
Rivista
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  • 4 (literal)
Note
  • Scopus (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • - School of Physics, University of Hyderabad, Hyderabad 500 046, India - CNR-IFN, CSMFO Lab., via alla Cascata 56/c, Povo, 38123 Trento, Italy - Fondazione Bruno Kessler FBK, via Sommarive 18 Povo, 38123 Trento, Italy - LASIR (CNRS, UMR 8516), Université des Sciences et Technologies de Lille (USTL), 59655 Villeneuved'Ascq, France - CNR-IFAC, MDF Laboratory, 50019 Sesto Fiorentino, Italy (literal)
Titolo
  • Fabrication and characterization of Er+3 doped SiO2/SnO2 glass-ceramic thin films for planar waveguide applications (literal)
Abstract
  • Glass-ceramics are a kind of two-phase materials constituted by nanocrystals embedded in a glass matrix and the respective volume fractions of crystalline and amorphous phase determine the properties of the glass-ceramics. Among these properties transparency is crucial in particular when confined structures, such as, dielectric optical waveguides, are considered. Moreover, the segregation of dopant rare-earth ions, like erbium, in low phonon energy crystalline medium makes these structures more promising in the development of waveguide amplifiers. Here we are proposing a new class of low phonon energy tin oxide semiconductor medium doped silicate based planar waveguides. Er3+ doped (100-x) SiO2- xSnO2 (x= 10, 20, 25 and 30mol%), glass-ceramic planar waveguide thin films were fabricated by a simple sol-gel processing and dip coating technique. XRD and HRTEM studies indicates the glass-ceramic phase of the film and the dispersion of ~4nm diameter of tin oxide nanocrystals in the amorphous phase of silica. The spectroscopic assessment indicates the distribution of the dopant erbium ions in the crystalline medium of tin oxide. The observed low losses, 0.5±0.2 dB/cm, at 1.54 ?m communication wavelength makes them a quite promising material for the development of high gain integrated optical amplifiers. (literal)
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