http://www.cnr.it/ontology/cnr/individuo/prodotto/ID314623
Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films (Articolo in rivista)
- Type
- Label
- Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films (Articolo in rivista) (literal)
- Anno
- 2015-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.materresbull.2014.09.055 (literal)
- Alternative label
Araujo, E. B.; Nahime, B. O.; Melo, M.; Dinelli, F.; Tantussi, F.; Baschieri, P.; Fuso, F.; Allegrini, M. (2015)
Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films
in Materials research bulletin
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Araujo, E. B.; Nahime, B. O.; Melo, M.; Dinelli, F.; Tantussi, F.; Baschieri, P.; Fuso, F.; Allegrini, M. (literal)
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Universidade Estadual Paulista; Consiglio Nazionale delle Ricerche (CNR); University of Pisa (literal)
- Titolo
- Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films (literal)
- Abstract
- Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale. (C) 2014 Elsevier Ltd. All rights reserved. (literal)
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