Phase delay characterization of multilayer coatings for FEL applications (Contributo in atti di convegno)

Type

• Contributo in atti di convegno (Classe)
• Prodotto della ricerca (Classe)

Label

• Phase delay characterization of multilayer coatings for FEL applications (Contributo in atti di convegno) (literal)

Anno

• 2014-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1117/12.2061818 (literal)

Alternative label

• Corso, Alain J.; Tessarolo, Enrico; Zuppella, Paola; Zuccon, Sara; Nardello, Marco; Pelizzo, Maria G. (2014)
  Phase delay characterization of multilayer coatings for FEL applications
  in SPIE Optics + Photonics San Diego 2014
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Corso, Alain J.; Tessarolo, Enrico; Zuppella, Paola; Zuccon, Sara; Nardello, Marco; Pelizzo, Maria G. (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 9207 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#volumeInCollana

• 9207 (literal)

Rivista

• Proceedings of SPIE, the International Society for Optical Engineering (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 6 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• Consiglio Nazionale delle Ricerche (CNR) (literal)

Titolo

• Phase delay characterization of multilayer coatings for FEL applications (literal)

Abstract

• The phase delay induced by multilayer (ML) mirrors is an important feature in many fields such as attosecond pulses compression, photolithography or in pump and probe experiments performed with Free Electron Laser (FEL) pulses. The experimental characterization of the ML phase delay can be obtained by the standing wave distribution measurement (by using Total Electron Yield (TEY) signal) combined to reflectance measurement. In this work, a ML structure with aperiodic capping-layers was designed and deposited for FEL applications and their reflectance and phase delay was characterized. The method adopted allows to retrieve the ML phase delay by using the TEY signals taken at different working configurations and it doesn't require the comparison with a bulk reference sample. The results obtained are presented and discussed. (literal)

Prodotto di

• Coatings And Optical materialS (MD.P03.010.003) (Modulo)
• Istituto di fotonica e nanotecnologie (IFN) (Istituto)

Autore CNR

• ALAIN JODY CORSO (Persona)
• PAOLA ZUPPELLA (Persona)
• MARIA GUGLIELMINA PELIZZO (Persona)

Insieme di parole chiave

• Keywords of "Phase delay characterization of multilayer coatings for FEL applications" (Insieme di parole chiave)

Incoming links:

Prodotto

• Istituto di fotonica e nanotecnologie (IFN) (Istituto)
• Coatings And Optical materialS (MD.P03.010.003) (Modulo)

Autore CNR di

• MARIA GUGLIELMINA PELIZZO (Persona)
• PAOLA ZUPPELLA (Persona)
• ALAIN JODY CORSO (Persona)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Proceedings of SPIE, the International Society for Optical Engineering (Rivista)

Insieme di parole chiave di

• Keywords of "Phase delay characterization of multilayer coatings for FEL applications" (Insieme di parole chiave)