http://www.cnr.it/ontology/cnr/individuo/prodotto/ID310257
Surface nanostructures in manganite films (Articolo in rivista)
- Type
- Label
- Surface nanostructures in manganite films (Articolo in rivista) (literal)
- Anno
- 2014-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1038/srep05353 (literal)
- Alternative label
Gambardella, Alessandro; Graziosi, Patrizio; Bergenti, Ilaria; Prezioso, Mirko; Pullini, Daniele; Milita, Silvia; Biscarini, Fabio; Dediu, Valentin Alek (2014)
Surface nanostructures in manganite films
in Scientific reports (Nature Publishing Group)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Gambardella, Alessandro; Graziosi, Patrizio; Bergenti, Ilaria; Prezioso, Mirko; Pullini, Daniele; Milita, Silvia; Biscarini, Fabio; Dediu, Valentin Alek (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.scopus.com/record/display.url?eid=2-s2.0-84902842853&origin=inward (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Note
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Istituto Per Lo Studio Dei Materiali Nanostrutturati, Rome; University of California, Santa Barbara; Fiat; Consiglio Nazionale delle Ricerche; Universita degli Studi di Modena e Reggio Emilia (literal)
- Titolo
- Surface nanostructures in manganite films (literal)
- Abstract
- Ultrathin manganite films are widely used as active electrodes in organic spintronic devices. In this study, a scanning tunnelling microscopy (STM) investigation with atomic resolution revealed previously unknown surface features consisting of small non-stoichiometric islands. Based upon this evidence, a new mechanism for the growth of these complex materials is proposed. It is suggested that the non-stoichiometric islands result from nucleation centres that are below the critical threshold size required for stoichiometric crystalline growth. These islands represent a kinetic intermediate of single-layer growth regardless of the film thickness, and should be considered and possibly controlled in manganite thin-film applications. (literal)
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- Autore CNR
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