Structure and morphology of thin MgO films on Mo(001) (Articolo in rivista)

Type
Label
  • Structure and morphology of thin MgO films on Mo(001) (Articolo in rivista) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1103/PhysRevB.78.195411 (literal)
Alternative label
  • Benedetti, S; Torelli, P; Valeri, S; Benia, HM; Nilius, N; Renaud, G (2008)
    Structure and morphology of thin MgO films on Mo(001)
    in Physical review. B, Condensed matter and materials physics
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Benedetti, S; Torelli, P; Valeri, S; Benia, HM; Nilius, N; Renaud, G (literal)
Pagina inizio
  • 195411-1 (literal)
Pagina fine
  • 195411-8 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://prb.aps.org/abstract/PRB/v78/i19/e195411 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 78 (literal)
Rivista
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  • 8 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • \"[Benedetti, S.; Torelli, P.; Valeri, S.] Univ Modena & Reggio Emilia, Dipartimento Fis, I-41100 Modena, Italy; [Benedetti, S.; Torelli, P.; Valeri, S.] Univ Modena & Reggio Emilia, CNR INFM, Natl Res Ctr Nanostruct & Biosyst & Surfaces S3, I-41100 Modena, Italy; [Benia, H. M.; Nilius, N.] Max Planck Gesell, Fritz Haber Inst, D-14195 Berlin, Germany; [Renaud, G.] NRS, SP2M, Inac, CEA, F-38054 Grenoble, France (literal)
Titolo
  • Structure and morphology of thin MgO films on Mo(001) (literal)
Abstract
  • Using a combination of reciprocal and real-space techniques, the structural evolution and its effect on the surface morphology is investigated for MgO films of 1-30 ML thickness epitaxially grown on Mo(001). The strain induced by the mismatch with the substrate is relieved between 1 and 7 ML MgO due to the formation of an ordered network of interfacial misfit dislocations aligned along the MgO < 110 > directions, particularly evident after annealing the film at 1070 K. A dislocation periodicity of about 60 A has been determined by means of grazing incidence x-ray diffraction. The dislocations induce a tilting of the surface that appears in electron diffraction along the < 100 > MgO directions for thin films and changes to < 110 > directions when the oxide thickness increases. Scanning tunneling microscopy (STM) shows the presence of a regular pattern on the surface below 7 ML thickness associated to the dislocation network. With increasing thickness, screw dislocations connected by nonpolar steps appear on the oxide surface. Thanks to the combination of different diffraction techniques and STM measurements, a comprehensive picture of the relaxation mechanisms in MgO films on Mo(001) can be drawn. (literal)
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