http://www.cnr.it/ontology/cnr/individuo/prodotto/ID307103

Nano-crystalline Ag-PbTe thermoelectric thin films by a multi-target PLD system (Articolo in rivista)

Type

Prodotto della ricerca (Classe)
Articolo in rivista (Classe)

Label

Nano-crystalline Ag-PbTe thermoelectric thin films by a multi-target PLD system (Articolo in rivista) (literal)

Anno

2014-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

10.1016/j.apsusc.2014.12.031 (literal)

Alternative label

Cappelli E.; Bellucci A.; Medici L.; Mezzi A.; Kaciulis S.; Fumagalli F.; Di Fonzo F.; Trucchi D.M. (2014)
Nano-crystalline Ag-PbTe thermoelectric thin films by a multi-target PLD system
in Applied surface science
(literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

Cappelli E.; Bellucci A.; Medici L.; Mezzi A.; Kaciulis S.; Fumagalli F.; Di Fonzo F.; Trucchi D.M. (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

http://www.scopus.com/inward/record.url?eid=2-s2.0-84920901478&partnerID=q2rCbXpz (literal)

Rivista

Applied surface science (Rivista)

Note

Scopu (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

CNR-ISM, Montelibretti, Via Salaria Km 29.3, P.O.B. 10, 00016 Rome, Italy; CNR-IMAA, Tito Scalo, 85050 Potenza, Italy; CNR-ISMN, Montelibretti, Via Salaria Km 29.3, P.O.B. 10, 00016 Rome, Italy; Center Nano Science Technology at Polimi, I.I.T., Via Pascoli 70/3, 20133 Milano, Italy; Dip. Fisica, Un. Roma Sapienza, Piazzale Aldo Moro 2, 00185 Rome, Italy (literal)

Titolo

Nano-crystalline Ag-PbTe thermoelectric thin films by a multi-target PLD system (literal)

Abstract

It has been evaluated the ability of ArF pulsed laser ablation to grow nano-crystalline thin films of high temperature PbTe thermoelectric material, and to obtain a uniform and controlled Ag blending, through the entire thickness of the film, using a multi-target system in vacuum. The substrate used was a mirror polished technical alumina slab. The increasing atomic percentage of Ag effect on physical-chemical and electronic properties was evaluated in the range 300-575. K. The stoichiometry and the distribution of the Ag component, over the whole thickness of the samples deposited, have been studied by XPS (X-ray photoelectron spectroscopy) and corresponding depth profiles. The crystallographic structure of the film was analyzed by grazing incidence X-ray diffraction (GI-XRD) system. Scherrer analysis for crystallite size shows the presence of nano-structures, of the order of 30-35. nm. Electrical resistivity of the samples, studied by the four point probe method, as a function of increasing Ag content, shows a typical semi-conductor behavior. From conductivity values, carrier concentration and Seebeck parameter determination, the power factor of deposited films was calculated. Both XPS, Hall mobility and Seebeck analysis seem to indicate a limit value to the Ag solubility of the order of 5%, for thin films of ~200. nm thickness, deposited at 350. °C. These data resulted to be comparable to theoretical evaluation for thin films but order of magnitude lower than the corresponding bulk materials. (literal)

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