http://www.cnr.it/ontology/cnr/individuo/prodotto/ID306874
Defects and sensing properties of carbon nanotube-based devices (Articolo in rivista)
- Type
- Label
- Defects and sensing properties of carbon nanotube-based devices (Articolo in rivista) (literal)
- Anno
- 2015-01-01T00:00:00+01:00 (literal)
- Alternative label
S. Baldo, V. Scuderi, L. Tripodi, A. La Magna, S.G. Leonardi, N. Donato, G. Neri, S. Filice and S. Scalese (2015)
Defects and sensing properties of carbon nanotube-based devices
in Journal of Sensors and Sensor Systems; Copernicus publications, Göttingen (Germania)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- S. Baldo, V. Scuderi, L. Tripodi, A. La Magna, S.G. Leonardi, N. Donato, G. Neri, S. Filice and S. Scalese (literal)
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- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR-IMM Catania
Università degli Studi di Messina
Università degli Studi della Calabria (literal)
- Titolo
- Defects and sensing properties of carbon nanotube-based devices (literal)
- Abstract
- In this work we report on the development of back-gated carbon nanotube-field effect transistors
(CNT-FETs), with CNT layers playing the role of the channel, and on their electrical characterisation for sensing
applications. The CNTs have been deposited by electrophoresis on an interdigitated electrode region created on
a SiO2/Si substrate. Different kinds of CNTs have been used (MWCNTs by arc discharge in liquid nitrogen and
MWCNTs by chemical vapour deposition, CVD) and the electrical characterisation of the devices was performed
in a NH3- and NO2-controlled environment. Preliminary data have shown an increase in the channel resistance
under NH3 exposure, whereas a decrease is observed after exposure to NO2, and the sensitivity to each gas
depends on the kind of CNTs used for the device.
Furthermore, the defect formation by Si ion implantation on CNTs was investigated by high-resolution transmission
electron microscopy (TEM) and Raman analysis. The behaviour observed for the different devices can
be explained in terms of the interaction between structural or chemical defects in CNTs and the gas molecules. (literal)
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