http://www.cnr.it/ontology/cnr/individuo/prodotto/ID306516
Optical properties-microstructure-texture relationships of dried apple slices: Spatially resolved diffuse reflectance spectroscopy as a novel technique for analysis and process control (Articolo in rivista)
- Type
- Label
- Optical properties-microstructure-texture relationships of dried apple slices: Spatially resolved diffuse reflectance spectroscopy as a novel technique for analysis and process control (Articolo in rivista) (literal)
- Anno
- 2014-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.ifset.2013.09.014 (literal)
- Alternative label
Nguyen Do Trong, Nghia; Rizzolo, Anna; Herremans, Els; Vanoli, Maristella; Cortellino, Giovanna; Erkinbaev, Chyngyz; Tsuta, Mizuki; Spinelli, Lorenzo; Contini, Davide; Torricelli, Alessandro; Verboven, Pieter; De Baerdemaeker, Josse G.; Nicolaï, Bart M.; Saeys, Wouter (2014)
Optical properties-microstructure-texture relationships of dried apple slices: Spatially resolved diffuse reflectance spectroscopy as a novel technique for analysis and process control
in Innovative food science & emerging technologies
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Nguyen Do Trong, Nghia; Rizzolo, Anna; Herremans, Els; Vanoli, Maristella; Cortellino, Giovanna; Erkinbaev, Chyngyz; Tsuta, Mizuki; Spinelli, Lorenzo; Contini, Davide; Torricelli, Alessandro; Verboven, Pieter; De Baerdemaeker, Josse G.; Nicolaï, Bart M.; Saeys, Wouter (literal)
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- http://www.scopus.com/record/display.url?eid=2-s2.0-84897106471&origin=inward (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
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- Rivista
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Katholieke Universiteit Leuven; Consiglio per la Ricerca e la sperimentazione in Agricoltura; National Food Research Institute Tsukuba; Institute for Photonics and Nanotechnologies, Rome; Politecnico di Milano (literal)
- Titolo
- Optical properties-microstructure-texture relationships of dried apple slices: Spatially resolved diffuse reflectance spectroscopy as a novel technique for analysis and process control (literal)
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