Surface fingerprints of individual silicon nanocrystals in laser-annealed Si/SiO2 superlattice: Evidence of nanoeruptions of laser-pressurized silicon (Articolo in rivista)

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  • Surface fingerprints of individual silicon nanocrystals in laser-annealed Si/SiO2 superlattice: Evidence of nanoeruptions of laser-pressurized silicon (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.4729303 (literal)
Alternative label
  • Nikitin, Timur; Kemell, Marianna; Puukilainen, Esa; Boninelli, Simona; Iacona, Fabio; Rasanen, Markku; Ritala, Mikko; Novikov, Sergei; Khriachtchev, Leonid (2012)
    Surface fingerprints of individual silicon nanocrystals in laser-annealed Si/SiO2 superlattice: Evidence of nanoeruptions of laser-pressurized silicon
    in Journal of applied physics; AIP Publishing LLC, Melville, NY 11747 (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Nikitin, Timur; Kemell, Marianna; Puukilainen, Esa; Boninelli, Simona; Iacona, Fabio; Rasanen, Markku; Ritala, Mikko; Novikov, Sergei; Khriachtchev, Leonid (literal)
Pagina inizio
  • 124302 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 111 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 7 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 12 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Department of Chemistry, University of Helsinki, P.O. Box 55, FI-00014 Helsinki, Finland MATIS IMM CNR, Via Santa Sofia 64, I-95123 Catania, Italy Department of Micro and Nanosciences, Aalto University, P.O. Box 3500, FI-02015 Espoo, Finland (literal)
Titolo
  • Surface fingerprints of individual silicon nanocrystals in laser-annealed Si/SiO2 superlattice: Evidence of nanoeruptions of laser-pressurized silicon (literal)
Abstract
  • Silicon nanocrystals prepared by continuous-wave laser annealing of a free-standing Si/SiO2 superlattice are studied for the first time by using methods of surface analysis (scanning electron microscopy and atomic force microscopy). The surface topology and composition are compared with transmission electron microscopy images that show a projection through the whole film, allowing us to discriminate silicon nanocrystals located near the film surface. These nanocrystals have an unusual pear-like shape with the thinner part sticking out of the laser-illuminated surface. The non-spherical shape of these nanocrystals is explained by eruption of silicon pressurized at the stage of crystallization from the melt phase. This hypothesis is supported by the micro-Raman spectra which show low stress near the surface features, in contrast to the neighbouring regions having high compressive stress. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4729303] (literal)
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