http://www.cnr.it/ontology/cnr/individuo/prodotto/ID302513
High-resolution strain sensing on steel by Silicon-On-Insulator flexural resonators fabricated with chip-level vacuum packaging (Contributo in atti di convegno)
- Type
- Label
- High-resolution strain sensing on steel by Silicon-On-Insulator flexural resonators fabricated with chip-level vacuum packaging (Contributo in atti di convegno) (literal)
- Anno
- 2013-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1109/Transducers.2013.6626936 (literal)
- Alternative label
Belsito, L. and Ferri, M. and Mancarella, F. and Roncaglia, A. and Yan, J. and Seshia, A.A. and Soga, K. (2013)
High-resolution strain sensing on steel by Silicon-On-Insulator flexural resonators fabricated with chip-level vacuum packaging
in 17th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS 2013
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Belsito, L. and Ferri, M. and Mancarella, F. and Roncaglia, A. and Yan, J. and Seshia, A.A. and Soga, K. (literal)
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- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
- cited By 0; Conference of 2013 17th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS 2013 ; Conference Date: 16 June 2013 Through 20 June 2013; Conference Code:101747 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.scopus.com/inward/record.url?eid=2-s2.0-84891697440&partnerID=40&md5=06fe8ba0bab6b2770d9accd8518292ad (literal)
- Note
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Institute of Microelectronics and Microsystems, CNR, Bologna, Italy; Department of Engineering, University of Cambridge, Cambridge, United Kingdom (literal)
- Titolo
- High-resolution strain sensing on steel by Silicon-On-Insulator flexural resonators fabricated with chip-level vacuum packaging (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#isbn
- Abstract
- This paper reports on the fabrication and characterization of high-resolution strain sensors for steel based on Silicon On Insulator flexural resonators manufactured with chip-level LPCVD vacuum packaging. The sensors present high sensitivity (120 Hz/?), very high resolution (4 n), low drift, and near-perfect reversibility in bending tests performed in both tensile and compressive strain regimes. (literal)
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