Ballistic Transport at the Nanometric Inhomogeneities in Au/Nb:SrTiO3 Resistive Switches (Articolo in rivista)

Type
Label
  • Ballistic Transport at the Nanometric Inhomogeneities in Au/Nb:SrTiO3 Resistive Switches (Articolo in rivista) (literal)
Anno
  • 2014-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1002/admi.201300057 (literal)
Alternative label
  • Andrea Gerbi, Renato Buzio, Alessandro Gadaleta, Luca Anghinolfi, Michael Caminale, Emilio Bellingeri, Antonio Sergio Siri and Daniele Marré (2014)
    Ballistic Transport at the Nanometric Inhomogeneities in Au/Nb:SrTiO3 Resistive Switches
    in Advanced Materials Interfaces; Wiley-VCH Verlag Gmbh, Weinheim (Germania)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Andrea Gerbi, Renato Buzio, Alessandro Gadaleta, Luca Anghinolfi, Michael Caminale, Emilio Bellingeri, Antonio Sergio Siri and Daniele Marré (literal)
Pagina inizio
  • 1300057 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://onlinelibrary.wiley.com/doi/10.1002/admi.201300057/abstract (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 1 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 5 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR-SPIN National Research Council-Institute for Superconductivity, Innovative Materials and Devices, Genova, Italy Physics Department, University of Genova, Genova, Italy Paul Scherrer Institut, Villigen, Switzerland (literal)
Titolo
  • Ballistic Transport at the Nanometric Inhomogeneities in Au/Nb:SrTiO3 Resistive Switches (literal)
Abstract
  • Novel ballistic electron emission microscopy experiments are reported, aimed to directly visualize and quantify the local inhomogeneities of the effective Schottky barrier height on Au/Nb:SrTiO3 Schottky junctions dominated by interfacial resistance switching effects. The voltage-dependent variation of the local barrier height of the nanometric patches could explain the non-ideal behaviour of the resistance switching effects in transition-metal oxide cells. (literal)
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