http://www.cnr.it/ontology/cnr/individuo/prodotto/ID293216
Evolution of the secondary electron emission during the graphitization of thin C films (Articolo in rivista)
- Type
- Label
- Evolution of the secondary electron emission during the graphitization of thin C films (Articolo in rivista) (literal)
- Anno
- 2015-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.apsusc.2014.12.046 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Rosanna Larciprete (a,b); Davide Remo Grosso (b); Antonio Di Trolio (c); Roberto Cimino (b) (literal)
- Pagina inizio
- Pagina fine
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- Available online 17 December 2014. (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.sciencedirect.com/science/article/pii/S0169433214027342 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- (a) CNR - Institute for Complex Systems (ISC), U.O.S. Tor Vergata, Via Fosso del Cavaliere 100, 00133 Roma, Italy
(b) LNF-INFN, via E. Fermi 27, Frascati, RM, Italy
(c) CNR - Institute for Complex Systems (ISC), U.O.S. Monterotondo, Via Salaria km. 29.3, I-00015 Monterotondo St., Italy (literal)
- Titolo
- Evolution of the secondary electron emission during the graphitization of thin C films (literal)
- Abstract
- The relation between the atomic hybridization and the secondary electron emission yield (SEY) in carbon
materials has been investigated during the thermal graphitization of thin amorphous carbon layers
deposited by magnetron sputtering on Cu substrates. C1s core level, valence band and Raman spectroscopy
were used to follow the sp3->sp2 structural reorganization while the SEY curves as a function of
the kinetic energy of the incident electron beam were measured in parallel. We found that an amorphous
C layer with a thickness of a few tens of nanometers is capable to modify the secondary emission properties
of the clean copper surface, reducing the maximum yield from 1.4 to 1.2. A further SEY decrease
observed with the progressive conversion of sp3 hybrids into six-fold aromatic domains was related to the
electronic structure close to the Fermi level of the C-films. We found that a moderate structural quality
of the C layer is sufficient to notably decrease the SEY as aromatic clusters of limited size approach the
secondary emission properties of graphite. (literal)
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- Autore CNR
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