Noniterative image reconstruction method based on the subtraction of diffraction-intensity pattern (Articolo in rivista)

Type
Label
  • Noniterative image reconstruction method based on the subtraction of diffraction-intensity pattern (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1117/1.3644538 (literal)
Alternative label
  • Yang, Mingyang; Zhou, Jun; Petti, Lucia; Mormile, Pasquale (2011)
    Noniterative image reconstruction method based on the subtraction of diffraction-intensity pattern
    in Optical engineering (Bellingham, Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Yang, Mingyang; Zhou, Jun; Petti, Lucia; Mormile, Pasquale (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 50 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 5 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 11 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Ningbo University; Consiglio Nazionale delle Ricerche (CNR) (literal)
Titolo
  • Noniterative image reconstruction method based on the subtraction of diffraction-intensity pattern (literal)
Abstract
  • A noniterative image reconstruction method is proposed by the subtraction of diffraction intensity patterns based on the Fraunhofer diffraction theory. According to the linearity theorem of the Fourier transform, the process of the noniterative image reconstruction is performed by numerical calculation, that is, the object wavefront can be extracted by the subtraction of three diffraction intensity patterns of an object and two hybrid masks. Furthermore, the way the noise impacts the quality of the reconstructed image is evaluated and the noise is suppressed by a median filtering algorithm. The results certify that the reconstructed image is consistent with the image of the object. The method provides us with an easy way for retrieving the wavefront with high quality in a wide class of wave fields such as optical, X-ray, electron, and atomic waves. (C) 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.3644538] (literal)
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