Single-crystal CuIn1 -xGaxSe2 films grown on lattice-matched Ge by low-temperature Pulsed Electron Deposition technique (Contributo in atti di convegno)

Type
Label
  • Single-crystal CuIn1 -xGaxSe2 films grown on lattice-matched Ge by low-temperature Pulsed Electron Deposition technique (Contributo in atti di convegno) (literal)
Anno
  • 2014-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1109/Fotonica.2014.6843938 (literal)
Alternative label
  • Colace, L. and Bronzoni, M. and De Iacovo, A. and Frigeri, P. and Gombia, E. and Maragliano, C. and Mezzadri, F. and Nasi, L. and Pattini, F. and Rampino, S. and Seravalli, L. and Trevisi, G. (2014)
    Single-crystal CuIn1 -xGaxSe2 films grown on lattice-matched Ge by low-temperature Pulsed Electron Deposition technique
    in 2014 Fotonica AEIT Italian Conference on Photonics Technologies, Napoli, 12-14 Maggio 2014
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Colace, L. and Bronzoni, M. and De Iacovo, A. and Frigeri, P. and Gombia, E. and Maragliano, C. and Mezzadri, F. and Nasi, L. and Pattini, F. and Rampino, S. and Seravalli, L. and Trevisi, G. (literal)
Pagina inizio
  • 1 (literal)
Pagina fine
  • 4 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6843938 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#titoloVolume
  • Photonics Technologies, 2014 Fotonica AEIT Italian Conference on (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • University of Roma Tre IMEM - CNR Masdar Institute - UAE (literal)
Titolo
  • Single-crystal CuIn1 -xGaxSe2 films grown on lattice-matched Ge by low-temperature Pulsed Electron Deposition technique (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#isbn
  • 978-8-8872-3718-4 (literal)
Abstract
  • We report on the epitaxial growth of Cu(In,Ga)Se2 (CIGS) thin films on n-type Ge substrates using the Pulsed Electron Deposition (PED) technique. Single-crystal films with smooth interface and no dislocations were obtained at a substrate temperature of 300°C with thickness above 1.5?m. CIGS/Ge epilayers were characterized in terms of Transmission Electron Microscopy, X-Ray Diffraction and Photoluminescence. Preliminary results are very promising for a variety of potential applications as absorber layer in single and multi-junction thin-film solar cells. (literal)
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