A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications (Articolo in rivista) (literal)

Anno

• 2008-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1007/s00339-008-4482-6 (literal)

Alternative label

• Bonizzoni, L; Caglio, S; Galli, A; Poldi, G (2008)
  A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications
  in Applied physics. A, Materials science & processing (Print)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Bonizzoni, L; Caglio, S; Galli, A; Poldi, G (literal)

Pagina inizio

• 203 (literal)

Pagina fine

• 210 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 92 (literal)

Rivista

• Applied physics. A, Materials science & processing (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• \"[Galli, A.] Univ Studi Milano Bicocca, Dipartimento Sci Mat, INFM, CNR, I-20125 Milan, Italy; [Bonizzoni, L.] Univ Milan, Ist Fis Gen Applicata, I-20133 Milan, Italy; [Caglio, S.; Poldi, G.] Dipartimento Anal Sci, I-20123 Milan, Italy; [Poldi, G.] Univ Verona, LANIAC, I-37129 Verona, Italy (literal)

Titolo

• A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications (literal)

Abstract

• Energy dispersive XRF analysis (EDXRF) in association with visible reflectance spectroscopy (vis-RS), both achieved by portable instruments, can be successfully applied, in a wide range of cases, to investigate wood or canvas paintings in order to obtain some stratigraphic information with non-invasive techniques. The specific aim of this work is to use them as quantitative tools: EDXRF to reconstruct the thicknesses of the detected layers, vis-RS to report pigment concentration in the uppermost layer. The method has been tested in the laboratory on paint layers with different composition of about 50 multilayers and more than 100 single layers [12]. We present here some in situ analyses of famous paintings by Andrea Mantegna and Giovanni Bellini, compared with stratigraphic optical microscopy observations on cross sections. Advantages and limits are pointed out. (literal)

Prodotto di

• Fotonica ultrabreve dall'infrarosso al EUV: applicazioni a materiali e dispositivi per ICT, magnetismo, biomedicina e nanoscienze (MD.P03.008.001) (Modulo)

Autore CNR

• ANNA GALLI (Unità di personale interno)

Insieme di parole chiave

• Keywords of "A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• ANNA GALLI (Unità di personale interno)

Prodotto

• Fotonica ultrabreve dall'infrarosso al EUV: applicazioni a materiali e dispositivi per ICT, magnetismo, biomedicina e nanoscienze (MD.P03.008.001) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Applied physics. A, Materials science & processing (Rivista)

Insieme di parole chiave di

• Keywords of "A non invasive method to detect stratigraphy, thicknesses and pigment concentration of pictorial multilayers based on EDXRF and vis-RS: in situ applications" (Insieme di parole chiave)