http://www.cnr.it/ontology/cnr/individuo/prodotto/ID282795
Crystal Defects in CdZnTe Crystals Grown by the Modified Low-Pressure Bridgman Method (Articolo in rivista)
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- Crystal Defects in CdZnTe Crystals Grown by the Modified Low-Pressure Bridgman Method (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1109/TNS.2011.2181414 (literal)
- Alternative label
Marchini, L.; Zappettini, A.; Zha, M.; Zambelli, N.; Bolotnikov, A. E.; Camarda, G. S.; James, R. B. (2012)
Crystal Defects in CdZnTe Crystals Grown by the Modified Low-Pressure Bridgman Method
in IEEE transactions on nuclear science; IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 (Stati Uniti d'America)
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Marchini, L.; Zappettini, A.; Zha, M.; Zambelli, N.; Bolotnikov, A. E.; Camarda, G. S.; James, R. B. (literal)
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- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=6145668 (literal)
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- IMEM CNR, I-43124 Parma, Italy; Brookhaven Natl Lab, Upton, NY 11973 USA (literal)
- Titolo
- Crystal Defects in CdZnTe Crystals Grown by the Modified Low-Pressure Bridgman Method (literal)
- Abstract
- Cadmium Zinc Telluride (CZT) is among the most promising materials for room-temperature X- and gamma-ray detectors. However, crystal defects such as Te inclusions and subgrain boundaries significantly hamper their performances. In this work, we evaluated CZT crystals grown by the modified low-pressure Bridgman technique at the IMEM Institute, Parma. We characterized the crystals by IR microscopy to identify the sizes and concentrations of the Te inclusions, along with high spatial resolution X-ray response mapping to measure the uniformity of their charge-transport properties. In addition, we employed white X-ray beam diffraction topography to analyze their crystalline structure. (literal)
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