Crystal Defects in CdZnTe Crystals Grown by the Modified Low-Pressure Bridgman Method (Articolo in rivista)

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  • Crystal Defects in CdZnTe Crystals Grown by the Modified Low-Pressure Bridgman Method (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1109/TNS.2011.2181414 (literal)
Alternative label
  • Marchini, L.; Zappettini, A.; Zha, M.; Zambelli, N.; Bolotnikov, A. E.; Camarda, G. S.; James, R. B. (2012)
    Crystal Defects in CdZnTe Crystals Grown by the Modified Low-Pressure Bridgman Method
    in IEEE transactions on nuclear science; IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Marchini, L.; Zappettini, A.; Zha, M.; Zambelli, N.; Bolotnikov, A. E.; Camarda, G. S.; James, R. B. (literal)
Pagina inizio
  • 264 (literal)
Pagina fine
  • 267 (literal)
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  • http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=6145668 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 59 (literal)
Rivista
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  • 4 (literal)
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  • 2 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • IMEM CNR, I-43124 Parma, Italy; Brookhaven Natl Lab, Upton, NY 11973 USA (literal)
Titolo
  • Crystal Defects in CdZnTe Crystals Grown by the Modified Low-Pressure Bridgman Method (literal)
Abstract
  • Cadmium Zinc Telluride (CZT) is among the most promising materials for room-temperature X- and gamma-ray detectors. However, crystal defects such as Te inclusions and subgrain boundaries significantly hamper their performances. In this work, we evaluated CZT crystals grown by the modified low-pressure Bridgman technique at the IMEM Institute, Parma. We characterized the crystals by IR microscopy to identify the sizes and concentrations of the Te inclusions, along with high spatial resolution X-ray response mapping to measure the uniformity of their charge-transport properties. In addition, we employed white X-ray beam diffraction topography to analyze their crystalline structure. (literal)
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