http://www.cnr.it/ontology/cnr/individuo/prodotto/ID280944
Nonlinear conductivity fluctuations in fe-chalcogenide superconductors (Articolo in rivista)
- Type
- Label
- Nonlinear conductivity fluctuations in fe-chalcogenide superconductors (Articolo in rivista) (literal)
- Anno
- 2013-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1109/TASC.2012.2232335 (literal)
- Alternative label
Barone, C.a , Pagano, S.a , Adamo, M.b , Sarnelli, E.b , Bellingeri, E.c , Ferdeghini, C.c (2013)
Nonlinear conductivity fluctuations in fe-chalcogenide superconductors
in IEEE transactions on applied superconductivity (Print)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Barone, C.a , Pagano, S.a , Adamo, M.b , Sarnelli, E.b , Bellingeri, E.c , Ferdeghini, C.c (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.scopus.com/inward/record.url?eid=2-s2.0-84873299322&partnerID=q2rCbXpz (literal)
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- a Dipartimento di Fisica, CNR SPIN, Università di Salerno, Fisciano (SA) 84084, Italy
b Istituto di Cibernetica Del CNR, Pozzuoli (NA) 80078, Italy
c Istituto SPIN Del CNR, Genova (GE) 16152, Italy (literal)
- Titolo
- Nonlinear conductivity fluctuations in fe-chalcogenide superconductors (literal)
- Abstract
- Electric transport and voltage-noise measurements on FeTe 0.5Se0.5 epitaxial thin films are reported. The films were grown by pulsed laser ablation deposition on lanthanum aluminate single crystal substrates, and subsequently patterned by ion beam etching. Several configurations, with different voltage contacts distances and different strip widths, have been measured. At low temperature and current bias, the measured low frequency 1/f noise behaves according to the standard resistance fluctuations model. Conversely, an excess unconventional 1/f noise is observed in the high-temperature region (T > 70\K). The experimental results indicate the existence of an electric field threshold, above which nonlinear fluctuation processes are activated. The results of noise measurements correlate well with the already reported change in sign of the Hall resistance in the same temperature range. Possible correlation between the hole contribution to the electrical transport and nonlinear noise effects observed is discussed. © 2002-2011 IEEE. (literal)
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