La0.8Sr0.2Ga0.8Mg0.2O3 (-) (delta) thin films for IT-SOFCs: Microstructure and transport properties correlation (Articolo in rivista)

Type
Label
  • La0.8Sr0.2Ga0.8Mg0.2O3 (-) (delta) thin films for IT-SOFCs: Microstructure and transport properties correlation (Articolo in rivista) (literal)
Anno
  • 2013-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.jpowsour.2012.08.072 (literal)
Alternative label
  • Nan Yang a, b, Alessandra D'Epifanio a, Elisabetta Di Bartolomeo a, Chiara Pugnalini a, Antonello Tebano b, Giuseppe Balestrino b, Silvia Licoccia a (2013)
    La0.8Sr0.2Ga0.8Mg0.2O3 (-) (delta) thin films for IT-SOFCs: Microstructure and transport properties correlation
    in Journal of power sources (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Nan Yang a, b, Alessandra D'Epifanio a, Elisabetta Di Bartolomeo a, Chiara Pugnalini a, Antonello Tebano b, Giuseppe Balestrino b, Silvia Licoccia a (literal)
Pagina inizio
  • 10 (literal)
Pagina fine
  • 14 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://dx.doi.org/10.1016/j.jpowsour.2012.08.072 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 222 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 5 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • a Department of Chemical Science and Technologies & NAST Center, University of Rome, Tor Vergata, Via della Ricerca Scientifica 1, 00133 Rome, Italy b CNR-SPIN & Dipartimento di Informatica, Sistemi e Produzione, University of Rome Tor Vergata, Via del Politecnico 1, 00133 Rome, Italy (literal)
Titolo
  • La0.8Sr0.2Ga0.8Mg0.2O3 (-) (delta) thin films for IT-SOFCs: Microstructure and transport properties correlation (literal)
Abstract
  • Highly textured La0.8Sr0.2Ga0.8Mg0.2O3 (LSGM) films with columnar structure were grown by pulsed laser deposition on (001) NdGaO3 and SrTiO3 buffered (001) MgO substrates. Combined analysis of the films structure and morphology and EIS measurements showed that the transport properties are mainly limited by perpendicular grain boundaries effects. Increasing the film thickness, columnar nanosized grains tend to coalesce leading to a decrease of grain boundary concentration, hence to enhanced conductivity. (literal)
Prodotto di
Autore CNR

Incoming links:


Autore CNR di
Prodotto
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
data.CNR.it