M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications (Articolo in rivista)

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  • M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications (Articolo in rivista) (literal)
Anno
  • 2013-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.tsf.2012.11.134 (literal)
Alternative label
  • I. Bányász, S. Berneschi, M. Fried, T. Lohner, G, Nunzi Conti, G.C. Righini, S. Pelli, Z. Zolnai (2013)
    M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications
    in Thin solid films (Print); Elsevier, Amsterdam (Paesi Bassi)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • I. Bányász, S. Berneschi, M. Fried, T. Lohner, G, Nunzi Conti, G.C. Righini, S. Pelli, Z. Zolnai (literal)
Pagina inizio
  • 3 (literal)
Pagina fine
  • 8 (literal)
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  • Bismuth germanate, Er-doped tungsten-tellurite glass, Interference phase contrast microscopy, Ion beam irradiation, M-line spectroscopy, Optical waveguide, Spectroscopic ellipsometry (literal)
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  • http://www.sciencedirect.com/science/article/pii/S0040609012016355 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 541 (literal)
Rivista
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  • 6 (literal)
Note
  • Scopu (literal)
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  • Wigner Research Centre for Physics, Hungarian Academy of Sciences, P.O.B. 49, H-1525, Budapest, Hungary Enrico Fermi Center for Study and Research, Piazza del Viminale 2, 00184 Roma, Italy MDF-Lab, Nello Carrara Institute of Applied Physics, IFAC-CNR, Via Madonna del Piano 10, 50019 Sesto Fiorentino (FI), Italy Institute of Technical Physics and Materials Science, Research Centre for Natural Sciences, Hungarian Academy of Sciences, P.O.B. 49, H-1525, Budapest, Hungary (literal)
Titolo
  • M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications (literal)
Abstract
  • Irradiation with N+ ions of the 1.5-3.5 MeV energy range was applied to optical waveguide formation. Planar and channel waveguides have been fabricated in an Er-doped tungsten-tellurite glass, and in both types of bismuth germanate (BGO) crystals: Bi4Ge3O12 (eulytine) and Bi12GeO20 (sillenite). Multi-wavelength m-line spectroscopy and spectroscopic ellipsometry were used for the characterisation of the ion beam irradiated waveguides. Planar waveguides fabricated in the Er-doped tungsten-tellurite glass using irradiation with N+ ions at 3.5 MeV worked even at the 1550 nm telecommunication wavelength. 3.5 MeV N + ion irradiated planar waveguides in eulytine-type BGO worked up to 1550 nm and those in sillenite-type BGO worked up to 1330 nm. (literal)
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