http://www.cnr.it/ontology/cnr/individuo/prodotto/ID274030
Influence of microstructure on voids nucleation in nanoporous Ge (Articolo in rivista)
- Type
- Label
- Influence of microstructure on voids nucleation in nanoporous Ge (Articolo in rivista) (literal)
- Anno
- 2013-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.matlet.2013.01.017 (literal)
- Alternative label
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- Romano L, Impellizzeri G, Grimaldi MG (literal)
- Pagina inizio
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- Rivista
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- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- [ 1 ] Univ Catania, CNR IMM MATIS, I-95123 Catania, Italy
[ 2 ] Univ Catania, Dept Phys & Astron, I-95123 Catania, Italy (literal)
- Titolo
- Influence of microstructure on voids nucleation in nanoporous Ge (literal)
- Abstract
- This paper reports about the mechanism of porous formation in bulk crystalline Ge wafers, polycrystalline and amorphous Ge thin films as a consequence of Ge+ ion implantation at 300 keV, Ge+ fluence 5 x 10(15) cm(-2) or 1 x 10(16) cm(-2). Cross-section scanning electron microscopy and Rutherford backscattering spectrometry were used to characterize the nucleation mechanism of the nanoporous structure by revealing a uniform mechanism in the amorphous Ge thin layers, and a heterogeneous growth mechanism in bulk crystalline and poly-crystalline Ge substrates. The uniform growth is due to the presence of voids distributed over all the as-deposited amorphous films, which provide nucleation sites for the formation of the porous structure. Instead, the heterogeneous growth is catalyzed by the free surface and the film/substrate interface. (literal)
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- Autore CNR
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