Pulsed laser deposition of ultrathin BaTiO3/Fe bi-layers: Structural characterization and piezoelectric response (Articolo in rivista)

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  • Pulsed laser deposition of ultrathin BaTiO3/Fe bi-layers: Structural characterization and piezoelectric response (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Alternative label
  • A. Zenkevich1,2 M. Minnekaev1, Yu. Lebedinskii1,2, K. Bulakh3, A. Chouprik3, A. Baturin3, R. Mantovan4, M. Fanciulli4,5, O. Uvarov2,6 (2012)
    Pulsed laser deposition of ultrathin BaTiO3/Fe bi-layers: Structural characterization and piezoelectric response
    in Thin solid films (Print); Elsevier BV, Amsterdam (Paesi Bassi)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • A. Zenkevich1,2 M. Minnekaev1, Yu. Lebedinskii1,2, K. Bulakh3, A. Chouprik3, A. Baturin3, R. Mantovan4, M. Fanciulli4,5, O. Uvarov2,6 (literal)
Pagina inizio
  • 4586 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.sciencedirect.com/science/article/pii/S0040609011019298# (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 520 (literal)
Rivista
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  • 14 (literal)
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  • 1 NRNU \"Moscow Engineering Physics Institute\", 115409, Moscow, Russia 2 NRC \"Kurchatov Institute\", NBIC Center, Moscow 123182, Russia 3 Moscow Institute of Physics and Technology, 141700 Moscow region, Russia 4 Laboratorio MDM IMM-CNR, I-20864 Agrate Brianza (MB), Italy 5 Dipartimento di Scienza dei Materiali, Università di Milano Bicocca, Milano, Italy 6 Prokhorov General Physics Institute, RAS, 119991 Moscow, Russia (literal)
Titolo
  • Pulsed laser deposition of ultrathin BaTiO3/Fe bi-layers: Structural characterization and piezoelectric response (literal)
Abstract
  • Ferroelectric ultrathin BaTiO3 (BTO) films in contact with Fe underlayer have been grown by pulsed laser deposition onto MgO(100) substrates in a single vacuum cycle. The structural properties of the composite system are investigated by Rutherford backscattering spectrometry/channeling and cross-sectional transmission electron microscopy. The BTO band gap is measured by in situ reflection electron energy loss spectroscopy to be Eg = 4.1-4.3 eV depending on the growth conditions. The ferroelectric nature of BTO (thickness down to 3 nm) on top of Fe is demonstrated by piezoresponse force microscopy, which shows an out-of-plane piezoelectric coefficient of 17 ± 4 pm/V. The obtained results are promising in the view of integrating BTO/Fe stacks in functional ferroelectric tunnel junctions. (literal)
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