Study of microstructure and magnetization reversal mechanism in granular CoCrPt:SiO2 films of variable thickness (Articolo in rivista)

Type
Label
  • Study of microstructure and magnetization reversal mechanism in granular CoCrPt:SiO2 films of variable thickness (Articolo in rivista) (literal)
Anno
  • 2013-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.matchemphys.2013.06.005 (literal)
Alternative label
  • Varvaro, G.[ 1 ] ; Testa, AM[ 1 ] ; Agostinelli, E.[ 1 ] ; Fiorani, D.[ 1 ] ; Laureti, S.[ 1 ] ; Springer, F.[ 2 ]; Brombacher, C.[ 2 ]; Albrecht, M.[ 2 ]; Del Bianco, L.[ 1 ] [ 4 ] [ 5 ] ; Barucca, G.[ 2 ]; Mengucci, P.[ 2 ]; Rinaldi, D.[ 2 ] (2013)
    Study of microstructure and magnetization reversal mechanism in granular CoCrPt:SiO2 films of variable thickness
    in Materials chemistry and physics (Print); ELSEVIER SCIENCE SA, PO BOX 564, 1001 LAUSANNE (Svizzera)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Varvaro, G.[ 1 ] ; Testa, AM[ 1 ] ; Agostinelli, E.[ 1 ] ; Fiorani, D.[ 1 ] ; Laureti, S.[ 1 ] ; Springer, F.[ 2 ]; Brombacher, C.[ 2 ]; Albrecht, M.[ 2 ]; Del Bianco, L.[ 1 ] [ 4 ] [ 5 ] ; Barucca, G.[ 2 ]; Mengucci, P.[ 2 ]; Rinaldi, D.[ 2 ] (literal)
Pagina inizio
  • 790 (literal)
Pagina fine
  • 796 (literal)
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  • http://biblioproxy.cnr.it:2052/science/article/pii/S0254058413004616 (literal)
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  • 141 (literal)
Rivista
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  • 7 (literal)
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  • 2-3 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • [ 1 ] CNR, Ist Struttura Mat, I-00015 Rome, Italy [ 2 ] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany [ 3 ] Univ Politecn Marche, Dipartimento SIMAU, I-60131 Ancona, Italy [ 4 ] Univ Bologna, Dipartimento Fis, I-40127 Bologna, Italy [ 5 ] CNISM, I-40127 Bologna, Italy (literal)
Titolo
  • Study of microstructure and magnetization reversal mechanism in granular CoCrPt:SiO2 films of variable thickness (literal)
Abstract
  • The effect of the thickness and microstructural features on the switching behaviour of granular CoCrPt:SiO2 films with perpendicular magnetic anisotropy was investigated. TEM plane view and cross section analysis indicate that, while the very first layers grow as uniform nanograins in dose contact, the growth proceeds by formation of well-defined CoCrPt columnar islands (7 nm average size) separated by the silicon oxide, the distance among the islands remaining roughly constant along the whole thickness. The relation between such non-uniform microstructure and the magnetization reversal mechanism at room temperature was investigated by performing hysteresis loops at variable angle as well as time dependent measurements by using a vector vibrating sample magnetometer. Numerical micromagnetic simulations of the hysteresis loops have been carried out to support the description of the experimental observations. The results showed a coexistence of coherent and incoherent reversal processes, the former being more and more pronounced with increasing the magnetic layer thickness, consistently with the microstructural investigations. (literal)
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