Temperature dependent structural evolution of graphene layers on 4H-SiC(0001) (Articolo in rivista)

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Label
  • Temperature dependent structural evolution of graphene layers on 4H-SiC(0001) (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.4028/www.scientific.net/MSF.679-680.797 (literal)
Alternative label
  • Sonde, S.a b and Vecchio, C.a b and Giannazzo, F.a and Bongiorno, C.a and Di Franco, S.a and Rambach, M.c and Rimini, E.a d and Raineri, V.a (2011)
    Temperature dependent structural evolution of graphene layers on 4H-SiC(0001)
    in Materials science forum
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Sonde, S.a b and Vecchio, C.a b and Giannazzo, F.a and Bongiorno, C.a and Di Franco, S.a and Rambach, M.c and Rimini, E.a d and Raineri, V.a (literal)
Pagina inizio
  • 797 (literal)
Pagina fine
  • 800 (literal)
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  • cited By (since 1996)2; Conference of org.apache.xalan.xsltc.dom.DOMAdapter@1c89fc83 ; Conference Date: org.apache.xalan.xsltc.dom.DOMAdapter@27210b18 Through org.apache.xalan.xsltc.dom.DOMAdapter@6a5f68b9; Conference Code:84545 (literal)
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  • http://www.scopus.com/inward/record.url?eid=2-s2.0-79955106784&partnerID=40&md5=81695db95380e3e3998ddc873db461e4 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 679-680 (literal)
Rivista
Note
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR-IMM, Strada VIII, 5, 95121, Catania, Italy; Scuola Superiore di Catania, Via San Nullo, 5/i, 95123, Catania, Italy; Centrotherm Thermal Solutions GmbH + Co. KG, Johannes-Schmid-Straße 8, 89143 Blaubeuren, Germany; Dipartimento di Fisica ed Astronomia, Università di Catani, Via S. Sofia, 64, 95123 Catania, Italy (literal)
Titolo
  • Temperature dependent structural evolution of graphene layers on 4H-SiC(0001) (literal)
Abstract
  • In this study we examined the structural evolution of graphene grown on 8° off-axis 4H-SiC(0001) substrates at temperatures from 1600°C to 1700°C in Ar ambient. Morphological transformation of SiC substrate after annealing was examined by Tapping Mode Atomic Force Microscopy. Moreover, by etching-out graphene layers from graphitized SiC substrates in selective trenches we determined the number of graphene layers. Numbers of graphene layers were then independently confirmed by Transmission Electron Microscopy imaging. (c) (2011) Trans Tech Publications. (literal)
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