Characterization of pulsed laser deposited a-C films by means of reflection electron energy loss spectroscopy (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Characterization of pulsed laser deposited a-C films by means of reflection electron energy loss spectroscopy (Articolo in rivista) (literal)

Anno

• 2001-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/S0040-6090(01)01449-3 (literal)

Alternative label

• Barreca, F., Mezzasalma, A.M., Mondio, G., Neri, F., Trusso, S. (2001)
  Characterization of pulsed laser deposited a-C films by means of reflection electron energy loss spectroscopy
  in Thin solid films (Print); ELSEVIER SCIENCE B.V., AMSTERDAM (Paesi Bassi)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Barreca, F., Mezzasalma, A.M., Mondio, G., Neri, F., Trusso, S. (literal)

Pagina inizio

• 228 (literal)

Pagina fine

• 232 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 398-399 (literal)

Rivista

• Thin solid films (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 5 (literal)

Note

• Scopu (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• Dipartimento di FMTFA, Ist. Naz. per la Fis. della Materia, Salita Sperone 31, I-98166, Messina, Italy IPCF-CNR Messina (literal)

Titolo

• Characterization of pulsed laser deposited a-C films by means of reflection electron energy loss spectroscopy (literal)

Abstract

• Amorphous carbon films have been deposited by ablating a high purity graphite target using a KrF excimer pulsed laser. Both the laser energy density (up to 15 J/cm2) and the substrate temperature (up to 900 K) were varied. Reflection electron energy loss spectra have been carried out in an ultra high vacuum surface analysis apparatus. The loss spectra were processed by removing the elastic peak contribution and the secondary electron background. The optical functions were deduced using a procedure based on the assumption that surface effects are negligible with respect to the bulk ones. The loss spectra are dominated by the presence of the ? and ? + ? plasma resonances, whose energy positions and shapes are significantly affected by the different preparation conditions. In particular, it has been made possible to determine, on the basis of reflection electron energy loss (REEL) data only, the sp2/sp3 bonding ratio. Overall, these results are also relevant for the correlation between the details of the preparation method and the material electronic properties. (literal)

Editore

• ELSEVIER SCIENCE B.V. (Editore)

Prodotto di

• Istituto per i processi chimico-fisici (IPCF) (Istituto)
• Sistemi macromolecolari, polimeri e fluidi complessi (MD.P01.014.001) (Modulo)

Autore CNR

• SEBASTIANO TRUSSO (Persona)

Incoming links:

Prodotto

• Istituto per i processi chimico-fisici (IPCF) (Istituto)
• Sistemi macromolecolari, polimeri e fluidi complessi (MD.P01.014.001) (Modulo)

Autore CNR di

• SEBASTIANO TRUSSO (Persona)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Thin solid films (Rivista)

Editore di

• ELSEVIER SCIENCE B.V. (Editore)