Properties of sputter-deposited Ni-Mn-Ga thin films (Articolo in rivista)

Type
Label
  • Properties of sputter-deposited Ni-Mn-Ga thin films (Articolo in rivista) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.msea.2006.12.206 (literal)
Alternative label
  • Chernenko V.A.; Besseghini S.; Hagler M.; Mullner P.; Ohtsuka M.; Stortiero F. (2008)
    Properties of sputter-deposited Ni-Mn-Ga thin films
    in Materials science & engineering. A, Structural materials: properties, microstructure and processing; ELSEVIER SCIENCE SA, PO BOX 564, 1001 LAUSANNE (Svizzera)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Chernenko V.A.; Besseghini S.; Hagler M.; Mullner P.; Ohtsuka M.; Stortiero F. (literal)
Pagina inizio
  • 271 (literal)
Pagina fine
  • 274 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • Proceedings of the 7th European Symposium on Martensitic Transformations, ESOMAT 2006 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.sciencedirect.com/science/article/pii/S0921509307012142 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 481 (literal)
Rivista
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  • 4 (literal)
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1 : Institute of Magnetism, Vernadsky Str. 36-b, Kiev 03142, Ukraine / 1,2,6 : CNR-IENI, Lecco, 23900, Italy / 3,4 : Department of Materials Science and Engineering, Boise State University, Boise, ID 83725, United States / 5 : IMRAM, Tohoku University, Sendai, 980-8577, Japan / (literal)
Titolo
  • Properties of sputter-deposited Ni-Mn-Ga thin films (literal)
Abstract
  • Sub-micrometer Ni-Mn-Ga films on MgO(0 0 1) single-crystalline wafers have been prepared by radio-frequency magnetron sputtering. The structural and magnetic states of the as-received (quasi-amorphous phase) and annealed (highly ordered martensitic phase at T = 300 K) films have been examined by X-ray diffraction, and measurements of resistivity and magnetization. The annealed films demonstrate a transformation behavior typical for the bulk and show a thickness dependence of the magnetic properties. (literal)
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