Profile Uniformity of Overlapped Oxide Dots Induced by Atomic Force Microscopy (Articolo in rivista)

Type
Label
  • Profile Uniformity of Overlapped Oxide Dots Induced by Atomic Force Microscopy (Articolo in rivista) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Alternative label
  • A.A. Tseng, A. Notargiacomo, T.P. Chen, Y. Liu (2010)
    Profile Uniformity of Overlapped Oxide Dots Induced by Atomic Force Microscopy
    in Journal of nanoscience and nanotechnology (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • A.A. Tseng, A. Notargiacomo, T.P. Chen, Y. Liu (literal)
Pagina inizio
  • 4390 (literal)
Pagina fine
  • 4399 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 10 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, Arizona 85287-6106, USA Department of Physics, Roma TRE University and Institute of Photonic and Nanotechnology-CNR Rome 00146, Italy School of Electrical and Electronic Engineering, Nanyang Technological University, 639798, Singapore Singapore Institute of Manufacturing Technology, 638075, Singapore (literal)
Titolo
  • Profile Uniformity of Overlapped Oxide Dots Induced by Atomic Force Microscopy (literal)
Prodotto di
Autore CNR

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