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CO2 Laser irradiation of GeO2 planar waveguide fabricated by rf-sputtering (Articolo in rivista)
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- Label
- CO2 Laser irradiation of GeO2 planar waveguide fabricated by rf-sputtering (Articolo in rivista) (literal)
- Anno
- 2013-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1364/OME.3.001561 (literal)
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A. Chiasera, C. Macchi, S. Mariazzi, S. Valligatla, L. Lunelli, C. Pederzolli, D.N. Rao, A. Somoza, R.S. Brusa, and M. Ferrari (2013)
CO2 Laser irradiation of GeO2 planar waveguide fabricated by rf-sputtering
in Optical materials express
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- A. Chiasera, C. Macchi, S. Mariazzi, S. Valligatla, L. Lunelli, C. Pederzolli, D.N. Rao, A. Somoza, R.S. Brusa, and M. Ferrari (literal)
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://dx.doi.org/10.1364/OME.3.001561 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
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- A. Chiasera,1,* C. Macchi,2 S. Mariazzi,3 S. Valligatla,1,4,5 L. Lunelli,6 C. Pederzolli,7 D.N. Rao,4 A. Somoza,8 R.S. Brusa,9 and M. Ferrari1
1CNR-IFN CSMFO Lab, Via alla Cascata 56/C, Povo, 38123 Trento, Italy
2IFIMAT, UNCentro and CONICET, Pinto 399, B7000GHG Tandil, Argentina
3Dipartimento di Fisica, Università di Trento and INFN, Gruppo collegato di Trento, Via Sommarive 14, I-38123 Povo, Trento, Italy
4School of Physics, University of Hyderabad, Hyderabad 500046, India.
5Università di Trento, Dipartimento di Fisica, via Sommarive 14, Povo, 38123 Trento, Italy
6Bruno Kessler Foundation and National Research Council Institute of Biophysics, via Sommarive 18, Trento Italy
7Bruno Kessler Foundation, via Sommarive 18, Trento Italy
8IFIMAT, UNCentro and CICPBA, Pinto 399, B7000GHG Tandil, Argentina
9Dipartimento di Fisica and CNISM, Università di Trento, Via Sommarive 14, I-38123 Trento, Italy
*Corresponding author: achiaser@science.unitn.it (literal)
- Titolo
- CO2 Laser irradiation of GeO2 planar waveguide fabricated by rf-sputtering (literal)
- Abstract
- GeO2 transparent glass ceramic planar waveguides were fabricated by a RF-sputtering technique and then irradiated by a pulsed CO2 laser. The effects of CO2 laser processing on the optical and structural properties of the waveguides were evaluated by different techniques including m-line, micro-Raman spectroscopy, atomic force microscopy, and positron annihilation spectroscopy. After laser annealing, an increase of the refractive index of approximately 0.04 at 1.5 µm and a decrease of the attenuation coefficient from 0.9 to 0.5 db/cm at 1.5 µm was observed. Raman spectroscopy and microscopy results put in evidence that the system embeds GeO2 nanocrystals and their phase varies with the irradiation time. Moreover, positron annihilation spectroscopy was used to study the depth profiling of the as prepared and laser annealed samples. The obtained results yielded information on the structural changes produced after the irradiation process inside the waveguiding films of approximately 1 µm thickness. In addition, a density value of the amorphous GeO2 samples was evaluated. (literal)
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