X-ray Excited Optical Luminescence Detection by Scanning Near-field Optical Microscope: a new tool for nanoscience (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• X-ray Excited Optical Luminescence Detection by Scanning Near-field Optical Microscope: a new tool for nanoscience (Articolo in rivista) (literal)

Anno

• 2008-01-01T00:00:00+01:00 (literal)

Alternative label

• S. Larcheri, F. Rocca, F. Jandard, D. Pailharey, R. Graziola,A. Kuzmin and J. Purans (2008)
  X-ray Excited Optical Luminescence Detection by Scanning Near-field Optical Microscope: a new tool for nanoscience
  in Review of scientific instruments
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• S. Larcheri, F. Rocca, F. Jandard, D. Pailharey, R. Graziola,A. Kuzmin and J. Purans (literal)

Pagina inizio

• 013702 (literal)

Pagina fine

• 1-9 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni

• Cit.Index: 1.384 Year: 2007 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 79 (literal)

Rivista

• Review of scientific instruments (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note

• 0034-6748 10.1063/1.2827485 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• [Larcheri, Silvia; Rocca, Francesco] CNR, IFN, Ist Foton & Nanotecnol, Unita FBK CeFSA Trento, I-38100 Trento, Italy; [Jandard, Frank; Pailharey, Daniel] CRMC N, F-13009 Marseille, France; [Jandard, Frank; Pailharey, Daniel] Univ Aix Marseille 2, F-13009 Marseille, France; [Graziola, Roberto] Univ Trent, Dipartimento Fis, I-38100 Trento, Italy; [Kuzmin, Alexei; Purans, Juris] Latvian State Univ, Inst Solid State Phys, LV-1063 Riga, Latvia (literal)

Titolo

• X-ray Excited Optical Luminescence Detection by Scanning Near-field Optical Microscope: a new tool for nanoscience (literal)

Abstract

• Investigations of complex nanostructured materials used in modern technologies require special experimental techniques able to provide information on the structure and electronic properties of materials with a spatial resolution down to the nanometer scale. We tried to address these needs through the combination of x-ray absorption spectroscopy (XAS) using synchrotron radiation micro beams with scanning near-field optical microscopy (SNOM) detection of the x-ray excited optical luminescence (XEOL) signal. This new instrumentation offers the possibility to carry out a selective structural analysis of the sample surface with the sub wavelength spatial resolution determined by the SNOM probe aperture. In addition, the apex of the optical fiber plays the role of a topographic probe, and chemical and topographic mappings can be simultaneously recorded. Our working XAS-SNOM prototype is based on a quartz tuning-fork head mounted on a high stability nano-positioning system; a coated optical fiber tip, operating as a probe in shear-force mode; a detection system coupled with the microscope head control system; a dedicated software/hardware set-up for synchronization of the XEOL signal detection with the synchrotron beamline acquisition system. We illustrate the possibility to obtain an element-specific contrast and to perform nano-XAS experiments by detecting the Zn K and W L3 absorption edges in luminescent ZnO and mixed ZnWO4-ZnO nanostructured thin films. (literal)

Prodotto di

• Sviluppo e diagnostica ottica e spettroscopica di materiali e strutture per la fotonica (MD.P03.012.001) (Modulo)
• Istituto di fotonica e nanotecnologie (IFN) (Istituto)

Autore CNR

• FRANCESCO ROCCA (Unità di personale esterno)
• SILVIA LARCHERI (Unità di personale esterno)

Insieme di parole chiave

• Parole chiave di "X-ray Excited Optical Luminescence Detection by Scanning Near-field Optical Microscope: a new tool for nanoscience" (Insieme di parole chiave)

Incoming links:

Prodotto

• Istituto di fotonica e nanotecnologie (IFN) (Istituto)
• Sviluppo e diagnostica ottica e spettroscopica di materiali e strutture per la fotonica (MD.P03.012.001) (Modulo)

Autore CNR di

• FRANCESCO ROCCA (Unità di personale esterno)
• SILVIA LARCHERI (Unità di personale esterno)
• http://www.cnr.it/ontology/cnr/individuo/unitaDiPersonaleEsterno/ID12905

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Review of scientific instruments (Rivista)

Insieme di parole chiave di

• Parole chiave di "X-ray Excited Optical Luminescence Detection by Scanning Near-field Optical Microscope: a new tool for nanoscience" (Insieme di parole chiave)