http://www.cnr.it/ontology/cnr/individuo/prodotto/ID249372
Single and double side YBCO thin films for X-band microwave filters and devices (Articolo in rivista)
- Type
- Label
- Single and double side YBCO thin films for X-band microwave filters and devices (Articolo in rivista) (literal)
- Anno
- 1999-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1142/s0217979299001399 (literal)
- Alternative label
Beneduce, C. and Bobba, F. and Boffa, M. and Cucolo, A. M. and Cucolo, M. C. and Andreone, A. and Aruta, C. and Iavarone, M. and Palomba, F. and Pica, G. and Salluzzo, M. and Vaglio, R. (1999)
Single and double side YBCO thin films for X-band microwave filters and devices
in International journal of modern physics b
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Beneduce, C. and Bobba, F. and Boffa, M. and Cucolo, A. M. and Cucolo, M. C. and Andreone, A. and Aruta, C. and Iavarone, M. and Palomba, F. and Pica, G. and Salluzzo, M. and Vaglio, R. (literal)
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- http://www.worldscientific.com/doi/abs/10.1142/S0217979299001399 (literal)
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- INFM-Dipartimento di Fisica, Università di Salerno, Italy
INFM-Dipartimento di Scienze Fisiche, Università di Napoli Federico II, Italy (literal)
- Titolo
- Single and double side YBCO thin films for X-band microwave filters and devices (literal)
- Abstract
- The properties of high quality single side and double side YBa2Cu2O7-delta (YBCO) thin films deposited on LaAlO3 substrates by pure oxygen d.c. sputtering are reported. The single side films are highly c-axis oriented with their a (or b) axis parallel to that of the substrate. The critical temperature is higher than 91 K with transition width less than 0.5 K, while the critical current density Je is higher than 3 MA/cm(2) at 77 K. The best double side samples exhibit no appreciable differences in the superconducting properties of the films deposited on the two different sides. X-ray analyses show in both cases highly c-axis oriented thin films with comparable values of the c-axis length (1.169 nm). The microwave properties are tested by a microstrip resonator technique. The surface resistance is lower than 80 mu Omega at 77 K and f=5.4 GHz while the penetration depth at low temperature is in the range 150-200 nm. (literal)
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