Analyzing integrated circuits at work with a picosecond time-gated imager (Articolo in rivista)

Type
Label
  • Analyzing integrated circuits at work with a picosecond time-gated imager (Articolo in rivista) (literal)
Anno
  • 2005-01-01T00:00:00+01:00 (literal)
Alternative label
  • D. Comelli, C. D’Andrea, G. Valentini, R. Cubeddu, R. Casiraghi, D. Cantarelli (2005)
    Analyzing integrated circuits at work with a picosecond time-gated imager
    in Optics express
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • D. Comelli, C. D’Andrea, G. Valentini, R. Cubeddu, R. Casiraghi, D. Cantarelli (literal)
Pagina inizio
  • 10075 (literal)
Pagina fine
  • 10084 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 13 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Titolo
  • Analyzing integrated circuits at work with a picosecond time-gated imager (literal)
Abstract
  • The apparatus allows one to record the temporal evolution of the luminescence emitted during transistor switching as a function of the position inside the chip. The system is characterized by an intrinsic parallelism in the spatial dimensions. This feature is noticeable for studying wide sections of complex circuits, like microprocessors and random access memories, where multiple electrical events occur simultaneously. Experiments on a CMOS inverter chain and on a static memory have been carried out, in order to demonstrate the applicability of a picosecond time-gated imager to circuit analysis. (literal)
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