http://www.cnr.it/ontology/cnr/individuo/prodotto/ID240613
MORPHOLOGY OF THIN SRF2 FILMS ON INP(111) STUDIED BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (Articolo in rivista)
- Type
- Label
- MORPHOLOGY OF THIN SRF2 FILMS ON INP(111) STUDIED BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (Articolo in rivista) (literal)
- Anno
- 1995-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/0022-0248(95)80111-O (literal)
- Alternative label
HEUN, S (HEUN, S); SUGIYAMA, M (SUGIYAMA, M); MAEYAMA, S (MAEYAMA, S); WATANABE, Y (WATANABE, Y); OSHIMA, M (OSHIMA, M) (1995)
MORPHOLOGY OF THIN SRF2 FILMS ON INP(111) STUDIED BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION
in Journal of crystal growth
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- HEUN, S (HEUN, S); SUGIYAMA, M (SUGIYAMA, M); MAEYAMA, S (MAEYAMA, S); WATANABE, Y (WATANABE, Y); OSHIMA, M (OSHIMA, M) (literal)
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- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- NIPPON TELEGRAPH & TEL PUBL CORP,INTERDISCIPLINARY RES LABS,3-9-11 MUSASHINO SHI,TOKYO 180,JAPAN. (literal)
- Titolo
- MORPHOLOGY OF THIN SRF2 FILMS ON INP(111) STUDIED BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (literal)
- Abstract
- We studied the growth of SrF2 on InP(111) by reflection high-energy electron diffraction (RHEED). This paper compares the surface and bulk crystalline structures of 35 Angstrom thick SrF2 grown on two InP(111) surfaces prepared in different ways. HF-etching of the InP(111) substrate resulted in a rough surface, whereas an As-treatment produced a flat surface without any superstructure. After being annealed at 500 degrees C for 10 min the SrF2 film deposited on the HF-etched surface showed a texture, whereas the film deposited on the As-treated InP(111) surface uas epitaxial and even had no twinning. (literal)
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