http://www.cnr.it/ontology/cnr/individuo/prodotto/ID240579

SPELEEM: Combining LEEM and spectroscopic imaging (Articolo in rivista)

Type

Prodotto della ricerca (Classe)
Articolo in rivista (Classe)

Label

SPELEEM: Combining LEEM and spectroscopic imaging (Articolo in rivista) (literal)

Anno

1998-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

10.1142/S0218625X98001626 (literal)

Alternative label

Schmidt, T (Schmidt, T); Heun, S (Heun, S); Slezak, J (Slezak, J); Diaz, J (Diaz, J); Prince, KC (Prince, KC); Lilienkamp, G (Lilienkamp, G); Bauer, E (Bauer, E) (1998)
SPELEEM: Combining LEEM and spectroscopic imaging
in Surface review and letters
(literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

Schmidt, T (Schmidt, T); Heun, S (Heun, S); Slezak, J (Slezak, J); Diaz, J (Diaz, J); Prince, KC (Prince, KC); Lilienkamp, G (Lilienkamp, G); Bauer, E (Bauer, E) (literal)

Pagina inizio

1287 (literal)

Pagina fine

1296 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

5 (literal)

Rivista

Surface review and letters (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

6 (literal)

Note

ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

[ 1 ] Sincrotrone Trieste, ELETTRA, I-34012 Basovizza Trieste, Italy [ 2 ] Tech Univ Clausthal, Inst Phys, D-38678 Clausthal Zellerfeld, Germany [ 3 ] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA (literal)

Titolo

SPELEEM: Combining LEEM and spectroscopic imaging (literal)

Abstract

At present the only surface electron microscope which allows true characteristic XPEEM (photoemission electron microscopy using synchrotron radiation) and structural characterization is the spectroscopic LEEM developed at the Technical University Clausthal in the early nineties. This instrument has in the past been used mainly for LEEM studies of various surface and thin film phenomena, because it had very limited access to synchrotron radiation. Now the microscope is connected quasipermanently to the undulator beamline 6.2 at the storage ring ELETTRA, operating successfully since the end of 1996 under the name SPELEEM (Spectroscopic PhotoEmission and Low Energy Electron Microscope). The high brightness of the ELETTRA light source, together with an optimized instrument, results in a spatial resolution better than 25 nm and an energy resolution better than 0.5 eV in the XPEEM mode. The instrument can be used alternately for XPEEM, LEEM, LEED (low energy electron diffraction), MEM (mirror electron microscopy) and other imaging modes, depending upon the particular problem studied. The combination of these imaging modes allows a comprehensive characterization of the specimen. This is of particular importance when the chemical identification of structural features is necessary for the understanding of a surface or thin film process. In addition, PED (photoelectron diffraction) and VPEAD (valence photoelectron angular distribution) of small selected areas give local atomic configuration and band structure information, respectively. (literal)

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