Comparison between performances of optical grating and Si-PIN detectors in soft X-ray (2-7 keV) spectroscopy (Articolo in rivista)

Type
Label
  • Comparison between performances of optical grating and Si-PIN detectors in soft X-ray (2-7 keV) spectroscopy (Articolo in rivista) (literal)
Anno
  • 1997-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1088/0963-9659/6/1/001 (literal)
Alternative label
  • Boscolo, A; Poletto, L; Tondello, G (1997)
    Comparison between performances of optical grating and Si-PIN detectors in soft X-ray (2-7 keV) spectroscopy
    in Journal of optics. A, Pure and applied optics (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Boscolo, A; Poletto, L; Tondello, G (literal)
Pagina inizio
  • L1 (literal)
Pagina fine
  • L6 (literal)
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  • 6 (literal)
Rivista
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  • 7 (literal)
Note
  • ISI Web of Science (WOS) (literal)
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  • UNIV PADUA,DEPT ELECT & INFORMAT,VIA GRADENIGO 6-A,I-35131 PADUA,ITALY. CNR-Istituto di Fotonica e Nanotecnologie (literal)
Titolo
  • Comparison between performances of optical grating and Si-PIN detectors in soft X-ray (2-7 keV) spectroscopy (literal)
Abstract
  • In soft x-ray spectroscopy the region from 2 to 7 keV is the most critical, because optical gratings are considered to become inefficient and solid-state detectors exhibit a relatively low energy resolution. We investigated the performances of ion-etched blazed gratings and of Silicon detectors as components for soft x-ray spectroscopy. The gratings were mounted in a Rowland geometry at angles of incidence varying from 89 degrees to 89.45 degrees. We used a microfocus soft x-ray as source and as the detector an uncoated channel electron multiplier sliding along the Rowland circle to scan the spectrum. We recorded several spectra between 2 and 7 keV. The spectral resolution obtained shows essentially almost slit limited line widths; the diffraction efficiency ranges from 1 to 3% at 89.35 degrees and up to 4.2% at 89 degrees. As a comparison, we recorded the same spectra with a Si-PIN diode, cooled at -30 degrees C by a Peltier circuit. The diode exhibits good sensitivity and low noise; the resolution obtained is around 280 eV, almost constant at the various energies. This experiment shows that it is possible to extend the classical spectroscopic techniques to the soft x-ray region in order to obtain complementary performances with respect to solid-state detectors. (literal)
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