Study of the isotropic contribution to the analysis of photoelectron diffraction experiments at the ALOISA beamline (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Study of the isotropic contribution to the analysis of photoelectron diffraction experiments at the ALOISA beamline (Articolo in rivista) (literal)

Anno

• 2002-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/S0368-2048(02)00176-7 (literal)

Alternative label

• F. Bruno, L. Floreano, A. Verdini, D. Cvetko, R. Gotter, A. Morgante, S. Terreni, M. Canepa (2002)
  Study of the isotropic contribution to the analysis of photoelectron diffraction experiments at the ALOISA beamline
  in Journal of electron spectroscopy and related phenomena (Print); ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• F. Bruno, L. Floreano, A. Verdini, D. Cvetko, R. Gotter, A. Morgante, S. Terreni, M. Canepa (literal)

Pagina inizio

• 85 (literal)

Pagina fine

• 92 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 127 (literal)

Rivista

• Journal of electron spectroscopy and related phenomena (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 8 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

• 1-2 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• [ 1 ] INFM, Lab TASC, I-34012 Trieste, Italy [ 2 ] Univ Ljubljana, Jozef Stefan Inst, Ljubljana, Slovenia [ 3 ] Sincrotrone Trieste, I-34012 Trieste, Italy [ 4 ] Univ Trieste, Dipartimento Fis, Trieste, Italy [ 5 ] Univ Genoa, INFM, Genoa, Italy [ 6 ] Univ Genoa, Dipartimento Fis, Genoa, Italy (literal)

Titolo

• Study of the isotropic contribution to the analysis of photoelectron diffraction experiments at the ALOISA beamline (literal)

Abstract

• The angular distribution of the intensity in photoemission experiments is affected by electron diffraction patterns and by a smoothly varying contribution originated by both intrumental details and physical properties of the samples. The peculiar variety of scattering configurations available at the ALOISA beamline experimental station in Trieste stimulated the developement of an analytical description for the smooth angular dependence sustaining the diffraction features. We present here the basic formulae and their application to experimental data taken on the Fe/Cu(3)Au(001) system in order to highlight the role of the various parameters included in the distribution function. A specific model for the surface illumination has been developed, and the overlayer thickness and surface roughness have been considered. (C) 2002 Elsevier Science B.V. All rights reserved. (literal)

Editore

• ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS (Editore)

Prodotto di

• MD.P06.016.001 Proprieta' elettroniche e strutturali di sistemi a bassa dimensionalita' (MD.P06.016.003) (Modulo)

Autore CNR

• ALBERTO MORGANTE (Unità di personale interno)
• ROBERTO GOTTER (Unità di personale interno)
• ALBERTO VERDINI (Unità di personale interno)
• LUCA FLOREANO (Persona)

Incoming links:

Autore CNR di

• LUCA FLOREANO (Persona)
• ALBERTO VERDINI (Unità di personale interno)
• ROBERTO GOTTER (Unità di personale interno)
• ALBERTO MORGANTE (Unità di personale interno)

Prodotto

• MD.P06.016.001 Proprieta' elettroniche e strutturali di sistemi a bassa dimensionalita' (MD.P06.016.003) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Journal of electron spectroscopy and related phenomena (Rivista)

Editore di

• ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS (Editore)