Effect of the surface processing on the secondary electron yield of Al alloy samples (Articolo in rivista)

Type
Label
  • Effect of the surface processing on the secondary electron yield of Al alloy samples (Articolo in rivista) (literal)
Anno
  • 2013-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1103/PhysRevSTAB.16.051003 (literal)
Alternative label
  • D. R. Grosso, M. Commisso, R. Cimino, R. Larciprete, R. Flammini, R. Wanzenberg (2013)
    Effect of the surface processing on the secondary electron yield of Al alloy samples
    in Physical review special topics. Accelerators and beams
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • D. R. Grosso, M. Commisso, R. Cimino, R. Larciprete, R. Flammini, R. Wanzenberg (literal)
Pagina inizio
  • art_n_051003 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://prst-ab.aps.org/abstract/PRSTAB/v16/i5/e051003 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 16 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 8 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 5 (literal)
Note
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • LNF-INFN, via E. Fermi 40, 00044 Frascati (Roma) Italy CNR-Institute for Complex Systems, via Fosso del Cavaliere 100, I-00133 Roma, Italy CNR- Istituto di Metodologie Inorganiche e Plasmi, Via Salaria Km. 29.300, I-00019, Monterotondo Scalo, Italy DESY, Notkestrasse 85, 22603 Hamburg, Germany (literal)
Titolo
  • Effect of the surface processing on the secondary electron yield of Al alloy samples (literal)
Abstract
  • In this study we have investigated the relation between the secondary electron yield (SEY) and the surface chemical state for technical Al alloy samples cut from the inner walls of the Petra III storage ring. SEY curves measured after prolonged electron beam irradiation at 500 eV showed maximum values (?max) between 1.8 and 1.5. By combining x-ray photoelectron spectroscopy with SEY measurements, we have been able to relate the surface chemical composition to the ?max values for the \"as-received\" surface (?max=2.7), for the electron beam conditioned sample (?max=1.8-1.5), and after substantially removing the surface contaminating layer by means of Ar+ ion sputtering (?max=1.3). Our detailed chemical analysis shows that the SEY strongly increases in the presence of the thin surface oxide film which unavoidably forms on the clean Al alloy sample under electron beam irradiation even in ultrahigh vacuum conditions, and suggests that the high reactivity of pure Al and Al alloys to oxygen could be the cause of the difference among the SEY values measured in different ultrahigh vacuum environments. (literal)
Prodotto di
Autore CNR

Incoming links:


Prodotto
Autore CNR di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
data.CNR.it