Tunneling as a Stochastic Process: A Path-integral Model for Microwave Experiments (Articolo in rivista)

Type
Label
  • Tunneling as a Stochastic Process: A Path-integral Model for Microwave Experiments (Articolo in rivista) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Alternative label
  • Ranfagni A., Ruggeri R., Mugnai D., Agresti A., Ranfagni C., Sandri P. (2003)
    Tunneling as a Stochastic Process: A Path-integral Model for Microwave Experiments
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Ranfagni A., Ruggeri R., Mugnai D., Agresti A., Ranfagni C., Sandri P. (literal)
Pagina inizio
  • 066611 (literal)
Pagina fine
  • 066615 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 67 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Titolo
  • Tunneling as a Stochastic Process: A Path-integral Model for Microwave Experiments (literal)
Abstract
  • Delay time results obtained in microwave experiments at frequencies above and below the cutoff frequency of different waveguide sections are interpreted on the basis of wave propagation in the presence of dissipative effects. Kac's original suggestion was the starting point for the formulation of a stochastic model, which has now been substantially improved, also in relation to the transition-elements theory of Feynman-Hibbs. In this way, an approach to the problem is provided, which is completely distinct from the ones formulated elsewhere. (literal)
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