Structure of Er-O complexes in crystalline Si (Articolo in rivista)

Type
Label
  • Structure of Er-O complexes in crystalline Si (Articolo in rivista) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1103/PhysRevB.69.153310 (literal)
Alternative label
  • F. D'Acapito, S. Mobilio, A. Terrasi, S. Scalese, G. Franzò, F. Priolo (2004)
    Structure of Er-O complexes in crystalline Si
    in Physical review. B, Condensed matter and materials physics
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • F. D'Acapito, S. Mobilio, A. Terrasi, S. Scalese, G. Franzò, F. Priolo (literal)
Pagina inizio
  • 153310 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 69 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 15 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • European Synchrotron Radiat Facil, CRG, GILDA, INFM,OGG, F-38043 Grenoble, France Univ Roma Tre, Dipartimento Fis, I-00146 Rome, Italy CNR, IMM, I-95121 Catania, Italy Univ Catania, INFM, I-95129 Catania, Italy Univ Catania, Dipartimento Fis, I-95129 Catania, Italy Ist Nazl Fis Nucl, Lab Nazl Frascati, I-00044 Frascati, Roma, Italy (literal)
Titolo
  • Structure of Er-O complexes in crystalline Si (literal)
Abstract
  • The local structure around Er3+ ions in Er+O doped silicon has been investigated by extended x-ray absorption spectroscopy. By comparing samples obtained by molecular-beam epitaxy and ion implantation a common structure comes out. Er is linked to five or six O atoms at around 2.24 Angstrom and there is a well defined Er-O-Si bond angle of 135degrees and an Er-Si separation of 3.6 Angstrom. The Er-Si distance is appreciably longer than that found in the more stable structures from ab-initio calculations and a discussion on the possible site for Er is presented. (literal)
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