Wetting behaviour and reactivity of lead free Au-In-Sn and Bi-In-Sn alloys on copper substrates (Articolo in rivista)

Type
Label
  • Wetting behaviour and reactivity of lead free Au-In-Sn and Bi-In-Sn alloys on copper substrates (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.ijadhadh.2006.09.008 (literal)
Alternative label
  • F. Gnecco; E. Ricci; S. Amore; D. Giuranno; G. Borzone; G. Zanicchi; R. Novakovic (2007)
    Wetting behaviour and reactivity of lead free Au-In-Sn and Bi-In-Sn alloys on copper substrates
    in International journal of adhesion and adhesives
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • F. Gnecco; E. Ricci; S. Amore; D. Giuranno; G. Borzone; G. Zanicchi; R. Novakovic (literal)
Pagina inizio
  • 409 (literal)
Pagina fine
  • 416 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 27 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
  • In: International Journal of Adhesion and Adhesives, vol. 27 (5) pp. 409 - 416. Elsevier, 2007. (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 5 (literal)
Note
  • Scopu (literal)
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR-IENI, Via De Marini 6, 16149 Genoa, Italy; DCCI-University of Genoa and Genoa Research Unit of National Consortium of Materials Science & Technology (INSTM), Via Dodecaneso, 31, 16146 Genoa, Italy (literal)
Titolo
  • Wetting behaviour and reactivity of lead free Au-In-Sn and Bi-In-Sn alloys on copper substrates (literal)
Abstract
  • The main objective of this work is to determine the wetting behaviour of lead-free solders on copper substrates in view of their applications in electronic industry. The wetting behaviour of X-In-Sn (X=Au, Bi) ternary molten alloys in contact with copper has been studied and compared with the corresponding behaviour of their binary subsystems with a particular attention to the In-Sn/Cu system. The contact angle measurements on Cu-plates were performed by using a sessile drop apparatus. The solder/copper interface was characterised by the SEM-EDS analysis. (literal)
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