http://www.cnr.it/ontology/cnr/individuo/prodotto/ID217836
Surface Characterization of CuInS2 with Lamellar Morphology (Articolo in rivista)
- Type
- Label
- Surface Characterization of CuInS2 with Lamellar Morphology (Articolo in rivista) (literal)
- Anno
- 1995-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1149/1.2050097 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Cattarin S.; Pagura C. ; Armelao L. ; Bertoncello R. ; Dietz N. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://jes.ecsdl.org/content/142/8/2818 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
- Note
- ISI Web of Science (WOS) (literal)
- Scopu (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1,2 : CNR,IST POLAROG & ELETTROCHIM PREPARAT,CORSO STATI UNITI 4,I-35100 PADUA,ITALY /
3,4 : UNIV PADUA,DIPARTIMENTO CHIM INORGAN METALLORGAN & ANALI,I-35131 PADUA,ITALY /
5 : N CAROLINA STATE UNIV,DEPT MAT SCI & ENGN,RALEIGH,NC 27695 (literal)
- Titolo
- Surface Characterization of CuInS2 with Lamellar Morphology (literal)
- Abstract
- Lamellar crystals of CuInS2 grown in a steep temperature gradient have been characterized. Dispersive x-ray analyses show a predominant stoichiometry Cu/In/S = 1/ 1/2 and inclusions of Cu deficient phases. The cleaved surface is smooth, but after chemical etching a fine structure appears, with a great number of closely packed microcrystals of a dendritic shape. X-ray diffraction spectra of lamellae only show the reflections of the CuInS2 (112) and of the CuIn5S8 (111) lattice planes, indicating a strongly oriented structure. Depth profiles of CuInS2 lamellae investigated with x-ray photoelectron spectroscopy show the presence at the cleaved surface of Cu deficient phases like CuIn5S8, which are a few tens of nanometers thick. The lamellar growth mechanism is discussed on the basis of these findings. X-ray photoelectron spectroscopy and secondary ion mass spectrometry investigations show that the oxidation behavior of the lamellar material resembles that of traditional CuInX2 phases (X = S, Se). (literal)
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