Surface Characterization of CuInS2 with Lamellar Morphology (Articolo in rivista)

Type
Label
  • Surface Characterization of CuInS2 with Lamellar Morphology (Articolo in rivista) (literal)
Anno
  • 1995-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1149/1.2050097 (literal)
Alternative label
  • Cattarin S.; Pagura C. ; Armelao L. ; Bertoncello R. ; Dietz N. (1995)
    Surface Characterization of CuInS2 with Lamellar Morphology
    in Journal of the Electrochemical Society
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Cattarin S.; Pagura C. ; Armelao L. ; Bertoncello R. ; Dietz N. (literal)
Pagina inizio
  • 2818 (literal)
Pagina fine
  • 2823 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://jes.ecsdl.org/content/142/8/2818 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 142 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 6 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 8 (literal)
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1,2 : CNR,IST POLAROG & ELETTROCHIM PREPARAT,CORSO STATI UNITI 4,I-35100 PADUA,ITALY / 3,4 : UNIV PADUA,DIPARTIMENTO CHIM INORGAN METALLORGAN & ANALI,I-35131 PADUA,ITALY / 5 : N CAROLINA STATE UNIV,DEPT MAT SCI & ENGN,RALEIGH,NC 27695 (literal)
Titolo
  • Surface Characterization of CuInS2 with Lamellar Morphology (literal)
Abstract
  • Lamellar crystals of CuInS2 grown in a steep temperature gradient have been characterized. Dispersive x-ray analyses show a predominant stoichiometry Cu/In/S = 1/ 1/2 and inclusions of Cu deficient phases. The cleaved surface is smooth, but after chemical etching a fine structure appears, with a great number of closely packed microcrystals of a dendritic shape. X-ray diffraction spectra of lamellae only show the reflections of the CuInS2 (112) and of the CuIn5S8 (111) lattice planes, indicating a strongly oriented structure. Depth profiles of CuInS2 lamellae investigated with x-ray photoelectron spectroscopy show the presence at the cleaved surface of Cu deficient phases like CuIn5S8, which are a few tens of nanometers thick. The lamellar growth mechanism is discussed on the basis of these findings. X-ray photoelectron spectroscopy and secondary ion mass spectrometry investigations show that the oxidation behavior of the lamellar material resembles that of traditional CuInX2 phases (X = S, Se). (literal)
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