Study of the connection between stacking faults evolution and step kinetics in misoriented 4H-SiC epitaxial growths (Articolo in rivista)

Type
Label
  • Study of the connection between stacking faults evolution and step kinetics in misoriented 4H-SiC epitaxial growths (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.susc.2011.07.010 (literal)
Alternative label
  • Camarda, M., La Via, F., La Magna, A. (2011)
    Study of the connection between stacking faults evolution and step kinetics in misoriented 4H-SiC epitaxial growths
    in Surface science
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Camarda, M., La Via, F., La Magna, A. (literal)
Pagina inizio
  • L67 (literal)
Pagina fine
  • L69 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#titoloOperaOriginale
  • a (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 605 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 21-22 (literal)
Note
  • Scopus (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR-IMM (literal)
Titolo
  • Study of the connection between stacking faults evolution and step kinetics in misoriented 4H-SiC epitaxial growths (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#linguaOperaOriginale
  • ita (literal)
Abstract
  • Three dimensional Kinetic Monte Carlo simulations on super-lattices are applied to study the evolution of several types of stacking faults during homo-epitaxial growths of (11-20) misoriented 4H silicon carbide (SiC). We show that these defects can either propagate throughout the entire epilayer (i.e. extended from the substrate up to the surface) or close in dislocation loops, in dependence on the surface kinetics. Furthermore, we demonstrate that the surface instability rules both stacking fault propagation and step bunching mechanism. (literal)
Prodotto di
Autore CNR

Incoming links:


Autore CNR di
Prodotto
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
data.CNR.it