Force gradient versus distance curves studied by atomic force microscopy (Contributo in atti di convegno)

Type
Label
  • Force gradient versus distance curves studied by atomic force microscopy (Contributo in atti di convegno) (literal)
Anno
  • 1997-01-01T00:00:00+01:00 (literal)
Alternative label
  • Labardi, M.; Gucciardi, P. G.; Allegrini, M. (1997)
    Force gradient versus distance curves studied by atomic force microscopy
    in NATO Advanced Study Institute on Micro/Nanotribology and Its Applications, Sesimbra, Portugal, JUN 16-28, 1996
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Labardi, M.; Gucciardi, P. G.; Allegrini, M. (literal)
Pagina inizio
  • 129 (literal)
Pagina fine
  • 134 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#titoloVolume
  • MICRO/NANOTRIBOLOGY AND ITS APPLICATIONS (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#volumeInCollana
  • 330 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • UNIV PISA,DIPARTIMENTO FIS,IST NAZL FIS MAT,PIAZZA TORRICELLI 2,I-56126 PISA,ITALY (literal)
Titolo
  • Force gradient versus distance curves studied by atomic force microscopy (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#isbn
  • 0-7923-4386-7 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autoriVolume
  • Bhushan, B (literal)
Abstract
  • Force gradients between silicon tips and (110) Si surfaces have been measured in Ar controlled atmosphere by means of an Atomic Force Microscope. Noncontact mode techniques have been exploited to investigate long range Van der Waals forces without the influence of meniscus forces. Measurements have been compared to the theoretical predictions for the induced dipole-dipole contribution. Theoretical curves need to be corrected for finite oscillation amplitude effects. (literal)
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