STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials (Articolo in rivista)

Type
Label
  • STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials (Articolo in rivista) (literal)
Anno
  • 2013-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.ultramic.2012.10.009 (literal)
Alternative label
  • Vincenzo Grillo, FrancescaRossi (2013)
    STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials
    in Ultramicroscopy (Amst.); ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Vincenzo Grillo, FrancescaRossi (literal)
Pagina inizio
  • 112 (literal)
Pagina fine
  • 129 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.sciencedirect.com/science/article/pii/S0304399112002665 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 125 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • a Centro S3, CNR--Istituto di Nanoscienze, Via Campi 213A, I-41125 Modena, Italy; b IMEM--CNR, Parco Area delle Scienze37/A, I-43010 Parma, Italy (literal)
Titolo
  • STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials (literal)
Abstract
  • A new graphical software (STEM_CELL) for analysis of HRTEM and STEM-HAADF images is here introduced in detail. The advantage of the software, beyond its graphic interface, is to put together different analysis algorithms and simulation (described in an associated article) to produce novel analysis methodologies. Different implementations and improvements to state of the art approach are reported in the image analysis, filtering, normalization, background subtraction. In particular two important methodological results are here highlighted: (i) the definition of a procedure for atomic scale quantitative analysis of HAADF images, (ii) the extension of geometric phase analysis to large regions up to potentially 1?m through the use of under sampled images with aliasing effects. (literal)
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