X-ray photoelectron spectroscopy and secondary-ion mass spectrometry of boron nitride thin films on austenitic stainless steel (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• X-ray photoelectron spectroscopy and secondary-ion mass spectrometry of boron nitride thin films on austenitic stainless steel (Articolo in rivista) (literal)

Anno

• 1993-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/0040-6090(93)90615-V (literal)

Alternative label

• G.M. Ingo, G. Padeletti (1993)
  X-ray photoelectron spectroscopy and secondary-ion mass spectrometry of boron nitride thin films on austenitic stainless steel
  in Thin solid films (Print); Elsevier Sequoia, Lausanne (Svizzera)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• G.M. Ingo, G. Padeletti (literal)

Pagina inizio

• 276 (literal)

Pagina fine

• 279 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 228 (literal)

Rivista

• Thin solid films (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 4 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

• 1-2 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• G.M. Ingo, G. Padeletti CNR, ISTITUTO DI TEORIA & STRUTTURA ELETTRONICA, AREA DELLA RICERCA DI ROMA, CP 10, 00016 MONTEROTONDO STAZIONE, ROME, ITALY (literal)

Titolo

• X-ray photoelectron spectroscopy and secondary-ion mass spectrometry of boron nitride thin films on austenitic stainless steel (literal)

Abstract

• In order to grow thin films of boron nitride (BN), AISI 316 austenitic stailess steels have been doped with 10 and 50 ppm B and then thermally treated in dissociated NH3. The chemical composition and the distribution of the segregated phases onto the stainless steel surfaces have been studied by means of X-ray photoelectron spectroscopy (XPS) and secondary-ion mass spectrometry (SIMS). XPS depth profiles and SIMS elemental images have shown that boron segregates and reacts with dissociated NH3, thus essentially forming hexagonal BN. In particular, on high-boron-doped material, the hexagonal BN layer almost uniformly covers the surface of the steel, while on low-boron-doped steel the formation of hexagonal BN occurs only at the grain boundaries. For both materials, SIMS images have revealed also the presence at the grain boundaries of complex carbide-nitride-boride species. © 1993. (literal)

Editore

• Elsevier Sequoia (Editore)

Prodotto di

• Sintesi e crescita di film e superfici nanostrutturate (PM.P05.004.002) (Modulo)
• Istituto per lo studio dei materiali nanostrutturati (ISMN) (Istituto)

Autore CNR

• GIUSEPPINA PADELETTI (Persona)
• GABRIEL MARIA INGO (Unità di personale interno)

Insieme di parole chiave

• Keywords of "X-ray photoelectron spectroscopy and secondary-ion mass spectrometry of boron nitride thin films on austenitic stainless steel" (Insieme di parole chiave)

Incoming links:

Prodotto

• Istituto per lo studio dei materiali nanostrutturati (ISMN) (Istituto)
• Sintesi e crescita di film e superfici nanostrutturate (PM.P05.004.002) (Modulo)

Autore CNR di

• GIUSEPPINA PADELETTI (Persona)
• GABRIEL MARIA INGO (Unità di personale interno)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Thin solid films (Rivista)

Editore di

• Elsevier Sequoia (Editore)

Insieme di parole chiave di

• Keywords of "X-ray photoelectron spectroscopy and secondary-ion mass spectrometry of boron nitride thin films on austenitic stainless steel" (Insieme di parole chiave)